EPM7256AETC100-5N Altera, EPM7256AETC100-5N Datasheet - Page 18

IC MAX 7000 CPLD 256 100-TQFP

EPM7256AETC100-5N

Manufacturer Part Number
EPM7256AETC100-5N
Description
IC MAX 7000 CPLD 256 100-TQFP
Manufacturer
Altera
Series
MAX® 7000Ar
Datasheet

Specifications of EPM7256AETC100-5N

Programmable Type
In System Programmable
Delay Time Tpd(1) Max
5.5ns
Voltage Supply - Internal
3 V ~ 3.6 V
Number Of Logic Elements/blocks
16
Number Of Macrocells
256
Number Of Gates
5000
Number Of I /o
84
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
100-TQFP, 100-VQFP
Voltage
3.3V
Memory Type
EEPROM
Number Of Logic Elements/cells
16
Family Name
MAX 7000A
# Macrocells
256
Number Of Usable Gates
5000
Frequency (max)
250MHz
Propagation Delay Time
5.5ns
Number Of Logic Blocks/elements
16
# I/os (max)
84
Operating Supply Voltage (typ)
3.3V
In System Programmable
Yes
Operating Supply Voltage (min)
3V
Operating Supply Voltage (max)
3.6V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
100
Package Type
TQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Lead Free Status / Rohs Status
Compliant

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MAX 7000A Programmable Logic Device Data Sheet
18
Programming Times
The time required to implement each of the six programming stages can
be broken into the following two elements:
By combining the pulse and shift times for each of the programming
stages, the program or verify time can be derived as a function of the TCK
frequency, the number of devices, and specific target device(s). Because
different ISP-capable devices have a different number of EEPROM cells,
both the total fixed and total variable times are unique for a single device.
Programming a Single MAX 7000A Device
The time required to program a single MAX 7000A device in-system can
be calculated from the following formula:
where: t
The ISP times for a stand-alone verification of a single MAX 7000A device
can be calculated from the following formula:
where: t
t
t
PROG
VER
A pulse time to erase, program, or read the EEPROM cells.
A shifting time based on the test clock (TCK) frequency and the
number of TCK cycles to shift instructions, address, and data into the
device.
=
=
t
VPULSE
t
Cycle
f
t
Cycle
TCK
t
PROG
PPULSE
VER
VPULSE
PPULSE
PTCK
VTCK
+
+
Cycle VTCK
--------------------------------
Cycle
------------------------------- -
= Programming time
= Sum of the fixed times to erase, program, and
= Number of TCK cycles to program a device
= TCK frequency
f TCK
= Verify time
= Sum of the fixed times to verify the EEPROM cells
= Number of TCK cycles to verify a device
f
TCK
verify the EEPROM cells
PTCK
Altera Corporation

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