STM32L151VB STMicroelectronics, STM32L151VB Datasheet - Page 70

• Manufacturer Part Number: STM32L151VB
• Description: Ultra-low-power ARM Cortex-M3 MCU with 128 Kbytes Flash, 32 MHz CPU, LCD, USB
• Manufacturer: STMicroelectronics

Specifications of STM32L151VB

• Operating Power Supply Range: 1.65 V to 3.6 V (without BOR) or 1.8 V to 3.6 V (with BOR option)
• Temperature Range: –40 to 85 °C
• 4 Modes: Sleep, Low-power run (9 μA at 32 kHz), Low-power sleep (4.4 μA),Stop with RTC (1.45 μA), Stop (570 nA), Standby (300 nA)
• Ultralow Leakage Per I/o: 50 nA
• Fast Wakeup From Stop: 8 μs
• Core: ARM 32-bit Cortex™-M3 CPU
• Dma: 7-channel DMA controller, supporting timers, ADC, SPIs, I2Cs and USARTs

Electrical characteristics
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Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
●
●
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 34.
Symbol Parameter
S
EMI
Corrupted program counter
Unexpected reset
Critical data corruption (control registers...)
Peak level
EMI characteristics
V
T
LQFP100 package
compliant with IEC
61967-2
A
DD
= 25 °C,
Conditions
= 3.3 V,
Doc ID 17659 Rev 6
0.1 to 30 MHz
30 to 130 MHz
130 MHz to 1GHz
SAE EMI Level
frequency band
Monitored
range 3
voltage
Max vs. frequency range
4 MHz
STM32L151xx, STM32L152xx
2.5
18
15
3
range 2
16 MHz
voltage
-6
5
4
2
range 1
32 MHz
voltage
-7
-5
-7
1
dBµV
Unit
-