IDT70V07 Integrated Device Technology, IDT70V07 Datasheet - Page 7

• Manufacturer Part Number: IDT70V07
• Description: 32k X 8 3.3v Dual-port
• Manufacturer: Integrated Device Technology

AC Test Conditions
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
NOTES:
1. Transition is measured 0mV from Low- or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM, CE = V
4. 'X' in part number indicates power rating (S or L).
Timing of Power-Up Power-Down
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
READ CYCLE
t
t
t
t
t
t
t
t
t
t
t
RC
AA
ACE
AOE
OH
LZ
HZ
PU
PD
SOP
SAA
IDT70V07S/L
High-Speed 32K x 8 Dual-Port Static RAM
Symbol
Read Cycle Time
Chip Enable Access Time
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
Output High-Z Time
Chip Enable to Power Up Time
Chip Disable to Power Down Time
Semaphore Flag Update Pulse (OE or SEM)
Semaphore Address Access Time
Address Access Time
IL
and SEM = V
(1,2)
(1,2)
I
CE
I
CC
SB
IH
. To access semaphore, CE = V
Parameter
(3)
(2)
(2)
Figures 1 and 2
GND to 3.0V
1.5V
1.5V
3ns
t
PU
2943 tbl 10
IH
and SEM = V
7
DATA
Figure 1. AC Output Test Load
Min.
BUSY
____
____
____
____
____
____
25
15
3
3
0
IL
70V07X25
OUT
INT
.
Com'l
& Ind
435Ω
Max.
____
____
____
____
____
25
25
25
35
15
15
t
Industrial and Commercial Temperature Ranges
PD
Min.
3.3V
____
____
____
____
____
____
2943 drw 07
35
15
(4)
3
3
0
Com'l Only
70V07X35
2943 drw 05
590Ω
30pF
Max.
____
____
____
____
____
35
35
20
20
35
45
,
DATA
OUT
Min.
____
____
____
____
____
____
Figure 2. Output Test Load
55
15
3
3
0
Com'l Only
70V07X55
* Including scope and jig.
435Ω
(for t
LZ
, t
Max.
____
____
____
____
____
55
55
30
25
50
65
HZ
, t
WZ
3.3V
, t
2943 drw 06
2943 tbl 11
OW
Unit
590Ω
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
5pF*
)