m12l16161a Elite Semiconductor Memory Technology Inc., m12l16161a Datasheet - Page 5

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m12l16161a

Manufacturer Part Number
m12l16161a
Description
512k X 16bit X 2banks Synchronous Dram
Manufacturer
Elite Semiconductor Memory Technology Inc.
Datasheet

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AC OPERATING TEST CONDITIONS (V
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
Note: 1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and
Elite Semiconductor Memory Technology Inc.
RAS to CAS delay
Row active time
Input levels (Vih/Vil)
Input timing measurement reference level
Input rise and fall time
Output timing measurement reference level
Output load condition
Row active to row active delay
Row precharge time
Row cycle time
Last data in to new col. Address delay
Last data in to row precharge
Last data in to burst stop
Col. Address to col. Address delay
Number of valid output data
Output
2.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
870
then rounding off to the next higher integer.
The earliest a precharge command can be issued after a Read command without the loss of data is CL+BL-2 clocks.
Minimum delay is required to complete write.
(Fig.1) DC Output Load circuit
Parameter
Parameter
3.3V
1200
30 pF
DD
CAS latency=3
CAS latency=2
=3.3V
VOH(DC) = 2.4V, IOH = -2mA
VOL(DC) = 0.4V, IOL = 2mA
Symbol
t
t
t
t
t
t
t
t
t
t
RRD
RCD
RP
RAS
RAS
RC
CDL
RDL
BDL
CCD
(min)
(min)
±
(min)
(min)
(min)
(min)
(max)
(min)
(min)
(min)
0.3V,T
A
= 0 to 70 C
° )
10
15
15
30
48
-5
tr / tf = 1 / 1
See Fig.2
2.4 / 0.4
Value
1.4
1.4
Output
Version
100
1
2
1
1
2
1
(Fig.2) AC Output Load Circuit
14
20
20
42
63
-7
Revision : 2.7
Publication Date : Sep. 2008
Z0=50
M12L16161A
Unit
CLK
CLK
CLK
CLK
ns
ns
ns
ns
us
ns
ea
Unit
ns
Vtt =1.4V
V
V
V
50
30 pF
Ω
5/29
Note
1
1
1
1
1
2
2
2
3
4

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