FQB4N90 FAIRCHILD [Fairchild Semiconductor], FQB4N90 Datasheet

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FQB4N90

Manufacturer Part Number
FQB4N90
Description
900V N-Channel MOSFET
Manufacturer
FAIRCHILD [Fairchild Semiconductor]
Datasheet

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FQB4N90
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FQB4N90TM
Quantity:
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©2001 Fairchild Semiconductor Corporation
FQB4N90 / FQI4N90
900V N-Channel MOSFET
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for high efficiency switch mode power supplies.
Absolute Maximum Ratings
Thermal Characteristics
* When mounted on the minimum pad size recommended (PCB Mount)
V
I
I
V
E
I
E
dv/dt
P
T
T
R
R
R
D
DM
AR
J
L
Symbol
DSS
GSS
AS
AR
D
Symbol
, T
JC
JA
JA
stg
G
S
Drain-Source Voltage
Drain Current
Drain Current
Gate-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (T
Power Dissipation (T
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8” from case for 5 seconds
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient *
Thermal Resistance, Junction-to-Ambient
FQB Series
D
2
-PAK
D
- Continuous (T
- Continuous (T
- Pulsed
- Derate above 25°C
A
C
Parameter
Parameter
= 25°C) *
= 25°C)
G
D
T
S
C
C
C
= 25°C unless otherwise noted
= 25°C)
= 100°C)
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
Features
• 4.2A, 900V, R
• Low gate charge ( typically 24 nC)
• Low Crss ( typically 9.5 pF)
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
FQI Series
I
2
-PAK
FQB4N90 / FQI4N90
DS(on)
Typ
--
--
--
-55 to +150
= 3.3
2.65
16.8
3.13
1.12
570
140
300
900
4.2
4.2
4.0
14
30
G
@ V
!
!
Max
0.89
62.5
40
QFET
GS
! "
! "
= 10 V
!
!
!
!
S
D
"
"
"
"
"
"
October 2001
Rev. B, October 2001
Units
W/°C
Units
°C/W
°C/W
°C/W
mJ
mJ
°C
°C
W
W
V
A
A
A
V
A
V
TM

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FQB4N90 Summary of contents

Page 1

... A = 25°C) C Parameter October 2001 QFET = 3 DS(on " " ! " ! " " " " " FQB4N90 / FQI4N90 Units 900 V 4.2 A 2. 570 mJ 4 4.0 V 3.13 W 140 W 1.12 W/°C -55 to +150 °C 300 °C Typ Max ...

Page 2

Electrical Characteristics Symbol Parameter Off Characteristics BV Drain-Source Breakdown Voltage DSS BV Breakdown Voltage Temperature DSS / T Coefficient J I DSS Zero Gate Voltage Drain Current I Gate-Body Leakage Current, Forward GSSF I Gate-Body Leakage Current, Reverse GSSR On ...

Page 3

Typical Characteristics Top : 15 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5 Drain-Source Voltage [V] DS Figure 1. ...

Page 4

Typical Characteristics 1.2 1.1 1.0 0.9 0.8 -100 - Junction Temperature [ J Figure 7. Breakdown Voltage Variation vs. Temperature 2 10 Operation in This Area is Limited by R DS(on ...

Page 5

3mA 3mA Resistive Switching Test Circuit & Waveforms 10V 10V Unclamped Inductive Switching Test Circuit & Waveforms ...

Page 6

Peak Diode Recovery dv/dt Test Circuit & Waveforms Driver ) ( Driver ) DUT ) ( DUT ) DUT ) ( ...

Page 7

Package Dimensions 9.90 0.20 1.27 0.10 2.54 TYP 10.00 0.20 ©2001 Fairchild Semiconductor Corporation 2 D -PAK 4.50 0.80 0.10 2.54 TYP 10.00 (8.00) (4.40) (2XR0.45) 0.20 +0.10 1.30 –0.05 0.10 0.15 2.40 0.20 +0.10 0.50 –0.05 0.20 0.80 0.10 ...

Page 8

Package Dimensions (Continued) 9.90 1.27 0.10 2.54 TYP 10.00 ©2001 Fairchild Semiconductor Corporation 2 I -PAK 0.20 1.47 0.10 0.80 0.10 2.54 TYP 0.20 4.50 0.20 +0.10 1.30 –0.05 +0.10 0.50 2.40 –0.05 0.20 Dimensions in Millimeters Rev. B, October ...

Page 9

TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ACEx™ FAST Bottomless™ FASTr™ CoolFET™ FRFET™ CROSSVOLT™ GlobalOptoisolator™ DenseTrench™ GTO™ DOME™ ...

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