AT32UC3B0256-A2UR Atmel, AT32UC3B0256-A2UR Datasheet - Page 604

• Manufacturer Part Number: AT32UC3B0256-A2UR
• Description: MCU AVR32 256K FLASH 64-TQFP
• Manufacturer: Atmel
• Series: AVR®32 UC3r

Specifications of AT32UC3B0256-A2UR

• Package / Case: 64-TQFP, 64-VQFP
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Operating Temperature: -40°C ~ 85°C
• Speed: 60MHz
• Number Of I /o: 44
• Core Processor: AVR
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Program Memory Size: 256KB (256K x 8)
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Connectivity: I²C, IrDA, SPI, SSC, UART/USART, USB
• Core Size: 32-Bit
• Package: 64TQFP
• Device Core: AVR32
• Family Name: AT32
• Maximum Speed: 60 MHz
• Operating Supply Voltage: 1.8|3.3 V
• Data Bus Width: 32 Bit
• Number Of Programmable I/os: 44
• Interface Type: I2S/SPI/TWI/USART/USB
• On-chip Adc: 8-chx10-bit
• Number Of Timers: 3
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

27.5.2.4
27.5.2.5
32059K–03/2011
INTEST
CLAMP
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
Table 27-13. INTEST Details
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic
10. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
inputs.
inputs.
Details
00100 (0x04)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
AT32UC3B
604