ST72F561J4T6 STMicroelectronics, ST72F561J4T6 Datasheet - Page 233

IC MCU 8BIT 16K FLASH 44-LQFP

ST72F561J4T6

Manufacturer Part Number
ST72F561J4T6
Description
IC MCU 8BIT 16K FLASH 44-LQFP
Manufacturer
STMicroelectronics
Series
ST7r
Datasheet

Specifications of ST72F561J4T6

Core Processor
ST7
Core Size
8-Bit
Speed
8MHz
Connectivity
CAN, LINSCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
3.8 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
44-LQFP
Processor Series
ST72F5x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
CAN, SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
48
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Development Tools By Supplier
STX-RLINK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 16 Channel
For Use With
497-8374 - BOARD DEVELOPMENT FOR ST72F561
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

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0
EMC CHARACTERISTICS (Cont’d)
12.8.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity (see
Table 40
tion note AN1181.
12.8.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
Table 39. Absolute Maximum Ratings
Notes:
1. Data based on characterization results, not tested in production.
Table 40. Electrical Sensitivities
V
V
V
Symbol
ESD(HBM)
ESD(CDM)
ESD(MM)
Symbol
LU
below). For more details, refer to applica-
Electro-static discharge voltage (Human Body Model)
Electro-static discharge voltage (Machine Model)
Electro-static discharge voltage (Charge Device Model)
Static latch-up class
Parameter
Ratings
Table 39
T
conforming to JESD 78
A
and
=+125°C
number of supply pins in the device (3 parts*(n+1)
supply pin). Two models can be simulated: Human
Body Model and Machine Model. This test con-
forms to the JESD22-A114A/A115A standard.
12.8.3.2 Static Latch-Up
Conditions
LU: Two complementary static tests are
required on 6 parts to assess the latch-up
performance. A supply overvoltage (applied to
each power supply pin) and a current injection
(applied to each input, output and configurable I/
O pin) are performed on each sample. This test
conforms to the EIA/JESD 78 IC latch-up
standard.
Conditions
T
A
= +25°C
750 on corner pins,
Maximum value
500 on others
2000
200
II level A
Class
ST72561
1)
233/265
Unit
V

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