FDN306P Fairchild Semiconductor, FDN306P Datasheet
FDN306P
Specifications of FDN306P
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FDN306P Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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Lot Device Q20070335AAACLV FDC640P Q20070335ABACLV Q20070335BAACLV FDC655AN Q20070335BBACLV Q20070335CAACLV FDC654P Q20070335CBACLV Test: (High Temperature Reverse Bias) | Conditions: 150C, -16V | Standard: JESD22-A108 Lot Device Q20070335AAHTRB FDC640P Q20070335ABHTRB Test: (High Temperature Reverse Bias) | Conditions: 150C, -24V | Standard: JESD22-A108 ...
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Test: (Temperature Cycle) | Conditions: -65C, 150C | Standard: JESD22-A104 Lot Device Q20070335AATMCL1 FDC640P Q20070335ABTMCL1 Q20070335BATMCL1 FDC655AN Q20070335BBTMCL1 Q20070335CATMCL1 FDC654P Q20070335CBTMCL1 Results/Discussion for Qual Plan Number - Q20080485 Test: (High Temperature Reverse Bias) | Conditions: 150C, -16V | Standard: JESD22-A108 ...
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... Affected FSIDs : FDC606P_NBCE003A FDC642P_SB4N006 FDC658P_NB4E011 FDN304PZ FDN339AN FDN340P_G FDN359BN FDN360P_NBGT003B FDN5618P FDN5630_NB5N008A 100-CYCLES 0/77 500-CYCLES 0/77 100-CYCLES 0/77 500-CYCLES 0/77 100-CYCLES 0/77 500-CYCLES 0/77 FDC637AN_NB5E023A FDC654P_NBGT007 FDC658P_NB4E012 FDN304P FDN3400 FDN342P FDN360P FDN371N FDN5618P_SB4N007 FDC640P_NBAD004A FDC658P_NB4E009A FDN302P FDN306P FDN340P FDN359AN FDN360P_G FDN372S FDN5630 Pg. 4 ...