FDMS6673BZ Fairchild Semiconductor, FDMS6673BZ Datasheet - Page 3

• Manufacturer Part Number: FDMS6673BZ
• Description: MOSFET P-CH 30V 15.2A POWER56
• Manufacturer: Fairchild Semiconductor
• Series: PowerTrench®r

Specifications of FDMS6673BZ

• Fet Type: MOSFET P-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 6.8 mOhm @ 15.2A, 10V
• Drain To Source Voltage (vdss): 30V
• Current - Continuous Drain (id) @ 25° C: 15.2A
• Vgs(th) (max) @ Id: 3V @ 250µA
• Gate Charge (qg) @ Vgs: 130nC @ 10V
• Input Capacitance (ciss) @ Vds: 5915pF @ 15V
• Power - Max: 2.5W
• Mounting Type: Surface Mount
• Package / Case: 8-PQFN, Power56
• Configuration: Single Quad Drain Triple Source
• Transistor Polarity: P-Channel
• Resistance Drain-source Rds (on): 0.0068 Ohm @ 10 V
• Drain-source Breakdown Voltage: 30 V
• Gate-source Breakdown Voltage: +/- 25 V
• Continuous Drain Current: 15.2 A
• Power Dissipation: 2500 mW
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: FDMS6673BZTR

and are interchangeable. The reliability qualification is complete and results are detailed in the
attached table:
Results/Discussion for Qual Plan NumberQ20090181
Test: (Board Level Temperature Cycle) | Conditions: -10C, 100C | Standard: IPC-9701
Lot
Q20090181AABTMCL
Q20090181BABTMCL
Q20090181CABTMCL
Test: (High Temperature Reverse Bias) | Conditions: 125C, 24V | Standard: JESD22-A108
Lot
Q20090181BAHTRB
Q20090181BAHTRB
Q20090181CAHTRB
Q20090181CAHTRB
Test: (High Temperature Reverse Bias) | Conditions: 175C, 24V | Standard: JESD22-A108
Lot
Q20090181AAHTRB
Q20090181AAHTRB
Test: (High Temperature Storage Life) | Conditions: 175C | Standard: JESD22-A103
Lot
Q20090181AAHTSL
Q20090181BAHTSL
Q20090181CAHTSL
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, 24V | Standard: JESD22-A110
Lot
Q20090181AAHAST1
Q20090181BAHAST1
Q20090181CAHAST1
Test: (Power Cycle) | Conditions: Delta 100C, 2 Min cycle | Standard: MIL-STD-750-1036
Lot
Q20090181AAPRCL
Q20090181AAPRCL
Q20090181BAPRCL
Q20090181BAPRCL
Q20090181CAPRCL
Q20090181CAPRCL
Test: (Precondition) | Conditions: | Standard: JESD22-A113
Lot
Q20090181AAPCNL1A
Q20090181BAPCNL1A
Q20090181CAPCNL1A
Test: (Temperature Cycle) | Conditions: -65C, 150C | Standard: JESD22-A104
Lot
Q20090181AATMCL1
Q20090181AATMCL1
Q20090181BATMCL1
Q20090181BATMCL1
Q20090181CATMCL1
Q20090181CATMCL1
Test: (Unbiased HAST) | Conditions: 85%RH, 130C | Standard: JESD22-A118
Lot
Q20090181AAUHAST1
Q20090181BAUHAST1
Q20090181CAUHAST1
Product Id Description : Fairchild Semiconductor's selected MOSFET devices assembled in
Device
FDMS8692
FDMS8672AS
FDMS8670AS
Device
FDMS8672AS
FDMS8672AS
FDMS8670AS
FDMS8670AS
Device
FDMS8692
FDMS8692
Device
FDMS8692
FDMS8692
FDMS8672AS
FDMS8672AS
FDMS8670AS
FDMS8670AS
Device
FDMS8692
FDMS8692
FDMS8672AS
FDMS8672AS
FDMS8670AS
FDMS8670AS
Device
FDMS8692
FDMS8672AS
FDMS8670AS
Device
FDMS8692
FDMS8672AS
FDMS8670AS
Device
FDMS8692
FDMS8672AS
FDMS8670AS
Device
FDMS8692
FDMS8672AS
FDMS8670AS
100-HOURS
0/77
0/77
0/77
168-HOURS
0/77
0/77
168-HOURS
0/77
5000-CYCLES
0/77
0/77
0/77
100-CYCLES
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
Results
0/231
0/231
0/231
96-HOURS
0/77
0/77
0/77
500-HOURS
0/77
0/77
500-HOURS
0/77
10000-CYCLES
0/77
0/77
0/77
500-CYCLES
0/77
0/77
0/77
1000
0/77
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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