FDC606P Fairchild Semiconductor, FDC606P Datasheet - Page 2

• Manufacturer Part Number: FDC606P
• Description: MOSFET P-CH 12V 6A SSOT-6
• Manufacturer: Fairchild Semiconductor
• Series: PowerTrench®r
• Type: Power MOSFETr

Specifications of FDC606P

• Fet Type: MOSFET P-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 26 mOhm @ 6A, 4.5V
• Drain To Source Voltage (vdss): 12V
• Current - Continuous Drain (id) @ 25° C: 6A
• Vgs(th) (max) @ Id: 1.5V @ 250µA
• Gate Charge (qg) @ Vgs: 25nC @ 4.5V
• Input Capacitance (ciss) @ Vds: 1699pF @ 6V
• Power - Max: 800mW
• Mounting Type: Surface Mount
• Package / Case: 6-SSOT, SuperSOT-6
• Configuration: Single Quad Drain
• Transistor Polarity: P-Channel
• Resistance Drain-source Rds (on): 0.026 Ohm @ 4.5 V
• Forward Transconductance Gfs (max / Min): 25 S
• Drain-source Breakdown Voltage: 12 V
• Gate-source Breakdown Voltage: +/- 8 V
• Continuous Drain Current: 6 A
• Power Dissipation: 1600 mW
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Number Of Elements: 1
• Polarity: P
• Channel Mode: Enhancement
• Drain-source On-res: 0.026Ohm
• Drain-source On-volt: 12V
• Gate-source Voltage (max): ±8V
• Operating Temp Range: -55C to 150C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 6
• Package Type: SuperSOT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: FDC606P; FDC606PTR

Q20070335CBACLV
Test: (High Temperature Reverse Bias)
Lot
Q20070335AAHTRB
Q20070335ABHTRB
Q20070335BAHTRB
Q20070335BBHTRB
Q20070335CAHTRB
Q20070335CBHTRB
Test: (Power Cycle)
Lot
Q20070335AAPRCL
Q20070335AAPRCL
Q20070335ABPRCL
Q20070335ABPRCL
Q20070335BAPRCL
Q20070335BAPRCL
Q20070335BBPRCL
Q20070335BBPRCL
Q20070335CAPRCL
Q20070335CAPRCL
Q20070335CBPRCL
Q20070335CBPRCL
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070335AATMCL1
Q20070335AATMCL1
Q20070335ABTMCL1
Q20070335ABTMCL1
Q20070335BATMCL1
Q20070335BATMCL1
Q20070335BBTMCL1
Q20070335BBTMCL1
Q20070335CATMCL1
Q20070335CATMCL1
Q20070335CBTMCL1
Q20070335CBTMCL1
Test: 130C (Highly Accelerated Stress Test)
Lot
Q20070335AAHAST1
Q20070335ABHAST1
Q20070335BAHAST1
Q20070335BBHAST1
Q20070335CAHAST1
Q20070335CBHAST1
Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition)
Lot
Q20070335AAPCNL1A
Q20070335ABPCNL1A
Q20070335BAPCNL1A
Q20070335BBPCNL1A
Q20070335CAPCNL1A
Q20070335CBPCNL1A
Product Id Description : This change will affect products currently assembled in
Device
FDC640P
FDC655AN
FDC654P
Device
FDC640P
FDC640P
FDC640P
FDC640P
FDC655AN
FDC655AN
FDC655AN
FDC655AN
FDC654P
FDC654P
FDC654P
FDC654P
Device
FDC640P
FDC640P
FDC640P
FDC640P
FDC655AN
FDC655AN
FDC655AN
FDC655AN
FDC654P
FDC654P
FDC654P
FDC654P
FDC654P
Device
FDC640P
FDC640P
FDC655AN
FDC655AN
FDC654P
FDC654P
Device
FDC640P
FDC640P
FDC655AN
FDC655AN
FDC654P
FDC654P
168-HOURS
0/77
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
0/77
0/77
0/77
100-CYCLES
0/77
0/77
0/77
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
0/77
0/77
Results
0/231
0/231
0/231
0/231
0/231
0/231
10000-CYCLES
0/77
0/77
0/77
0/77
0/77
0/77
500-CYCLES
0/77
0/77
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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