FDB33N25TM Fairchild Semiconductor, FDB33N25TM Datasheet

MOSFET N-CH 250V 33A D2PAK

FDB33N25TM

Manufacturer Part Number
FDB33N25TM
Description
MOSFET N-CH 250V 33A D2PAK
Manufacturer
Fairchild Semiconductor
Series
UniFET™r
Datasheet

Specifications of FDB33N25TM

Fet Type
MOSFET N-Channel, Metal Oxide
Fet Feature
Standard
Rds On (max) @ Id, Vgs
94 mOhm @ 16.5A, 10V
Drain To Source Voltage (vdss)
250V
Current - Continuous Drain (id) @ 25° C
33A
Vgs(th) (max) @ Id
5V @ 250µA
Gate Charge (qg) @ Vgs
48nC @ 10V
Input Capacitance (ciss) @ Vds
2135pF @ 25V
Power - Max
235W
Mounting Type
Surface Mount
Package / Case
D²Pak, TO-263 (2 leads + tab)
Configuration
Single
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.094 Ohms @ 10 V
Drain-source Breakdown Voltage
250 V
Gate-source Breakdown Voltage
+/- 30 V
Continuous Drain Current
33 A
Power Dissipation
235 W
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDB33N25TMTR

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FDB33N25TM
Manufacturer:
FSC
Quantity:
1 600
Part Number:
FDB33N25TM
Manufacturer:
NEIMICON
Quantity:
400
Part Number:
FDB33N25TM
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
FDB33N25TM
0
Company:
Part Number:
FDB33N25TM
Quantity:
16 000
Company:
Part Number:
FDB33N25TM
Quantity:
2 500
©2006 Fairchild Semiconductor Corporation
FDB33N25 / FDI33N25 Rev A
FDB33N25 / FDI33N25
250V N-Channel MOSFET
Features
• 33A, 250V, R
• Low gate charge ( typical 36.8 nC)
• Low C
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
Absolute Maximum Ratings
Thermal Characteristics
* When mounted on the minimum pad size recommended (PCB Mount)
V
I
I
V
E
I
E
dv/dt
P
T
T
R
R
R
D
DM
AR
J,
L
DSS
GSS
AS
AR
D
Symbol
Symbol
θJC
θJA
θJA
T
STG
*
rss
( typical 39 pF)
G
DS(on)
Drain-Source Voltage
Drain Current
Drain Current
Gate-Source voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient*
Thermal Resistance, Junction-to-Ambient
Operating and Storage Temperature Range
S
= 0.094Ω @V
D
FDB Series
2
-PAK
D
GS
- Continuous (T
- Continuous (T
- Pulsed
(T
- Derate above 25°C
= 10 V
Parameter
Parameter
C
= 25°C)
G
C
C
D
= 25°C)
= 100°C)
S
1
Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies and active power factor
correction.
(Note 2)
(Note 1)
(Note 1)
(Note 3)
(Note 1)
I
FDI Series
2
-PAK
FDB33N25 / FDI33N25
Min.
--
--
--
-55 to +150
20.4
23.5
1.89
250
132
±30
918
235
300
4.5
33
33
G
Max.
0.53
62.5
40
UniFET
May 2006
S
D
www.fairchildsemi.com
Unit
W/°C
V/ns
Unit
mJ
mJ
°C/W
°C/W
°C/W
°C
°C
W
V
A
A
A
V
A
TM

Related parts for FDB33N25TM

FDB33N25TM Summary of contents

Page 1

... Thermal Resistance, Junction-to-Ambient* θJA R Thermal Resistance, Junction-to-Ambient θJA * When mounted on the minimum pad size recommended (PCB Mount) ©2006 Fairchild Semiconductor Corporation FDB33N25 / FDI33N25 Rev A Description = 10 V These N-Channel enhancement mode power field effect GS transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology ...

Page 2

... Package Marking and Ordering Information Device Marking Device FDB33N25 FDB33N25TM FDI33N25 FDI33N25TU Electrical Characteristics Symbol Parameter Off Characteristics BV Drain-Source Breakdown Voltage DSS ΔBV Breakdown Voltage Temperature DSS ΔT / Coefficient J I Zero Gate Voltage Drain Current DSS I Gate-Body Leakage Current, Forward GSSF ...

Page 3

Typical Performance Characteristics Figure 1. On-Region Characteristics Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5 Drain-Source ...

Page 4

Typical Performance Characteristics Figure 7. Breakdown Voltage Variation vs. Temperature 1.2 1.1 1.0 0.9 0.8 -100 - Junction Temperature [ J Figure 9. Maximum Safe Operating Area Operation in This Area is Limited ...

Page 5

Unclamped Inductive Switching Test Circuit & Waveforms FDB33N25 / FDI33N25 Rev A Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms 5 www.fairchildsemi.com ...

Page 6

FDB33N25 / FDI33N25 Rev A Peak Diode Recovery dv/dt Test Circuit & Waveforms 6 www.fairchildsemi.com ...

Page 7

Mechanical Dimensions FDB33N25 / FDI33N25 Rev PAK 7 Dimensions in Millimeters www.fairchildsemi.com ...

Page 8

Mechanical Dimensions FDB33N25 / FDI33N25 Rev PAK 8 Dimensions in Millimeters www.fairchildsemi.com ...

Page 9

... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ® ACEx™ FAST ActiveArray™ FASTr™ Bottomless™ FPS™ Build it Now™ FRFET™ CoolFET™ ...

Related keywords