FDD3N40 Fairchild Semiconductor, FDD3N40 Datasheet

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FDD3N40

Manufacturer Part Number
FDD3N40
Description
These N-channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, planar stripe, DMOS technology
Manufacturer
Fairchild Semiconductor
Datasheet

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©2007 Fairchild Semiconductor Corporation
FDD3N40 / FDU3N40 Rev. A
FDD3N40 / FDU3N40
400V N-Channel MOSFET
Features
• 2A, 400V, R
• Low gate charge ( typical 4.5 nC)
• Low C
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
Absolute Maximum Ratings
Thermal Characteristics
* Drain current limited by maximum junction temperature
V
I
I
V
E
I
E
dv/dt
P
T
T
R
R
D
DM
AR
J,
L
DSS
GSS
AS
AR
D
Symbol
Symbol
θJC
θJA
T
STG
rss
( typical 3.7 pF)
DS(on)
Drain-Source Voltage
Drain Current
Drain Current
Gate-Source voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Thermal Resistance, Junction-to-Case
Thermal Resistance, Case-to-Sink Typ.
G
= 3.4Ω @V
S
FDD Series
D-PAK
GS
= 10 V
D
- Continuous (T
- Continuous (T
- Pulsed
(T
- Derate above 25°C
Parameter
Parameter
C
= 25°C)
G
D
C
C
S
= 25°C)
= 100°C)
1
Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies and active power factor
correction.
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
FDU Series
I-PAK
FDD3N40 / FDU3N40
Typ
--
--
-55 to +150
1.25
0.24
400
±30
300
2.0
8.0
4.5
46
30
2
3
G
Max
110
4.2
UniFET
February 2007
S
D
www.fairchildsemi.com
Unit
W/°C
Unit
°C/W
°C/W
V/ns
mJ
mJ
°C
°C
W
V
A
A
A
V
A
TM

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FDD3N40 Summary of contents

Page 1

... Thermal Resistance, Junction-to-Case θJC R Thermal Resistance, Case-to-Sink Typ. θJA ©2007 Fairchild Semiconductor Corporation FDD3N40 / FDU3N40 Rev. A Description These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to ...

Page 2

... G ≤ 2A, di/dt ≤ 200A/µs, V ≤ Starting DSS 4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ Essentially Independent of Operating Temperature Typical Characteristics FDD3N40 / FDU3N40 Rev. A Package Reel Size D-PAK 380mm D-PAK 380mm I-PAK - T = 25°C unless otherwise noted ...

Page 3

... Figure 5. Capacitance Characteristics 350 300 C oss 250 C iss 200 150 100 C rss Drain-Source Voltage [V] DS FDD3N40 / FDU3N40 Rev. A Figure 2. Transfer Characteristics Notes : µ 1. 250 s Pulse Test Figure 4. Body Diode Forward Voltage 10V ...

Page 4

... Operation in This Area is Limited by R DS(on Drain-Source Voltage [V] DS Figure 11. Transient Thermal Response Curve FDD3N40 / FDU3N40 Rev. A (Continued) Figure 8. On-Resistance Variation 3.0 2.5 2.0 1.5 1.0 * Notes : µ 250 A 0.5 D 0.0 50 100 150 200 -100 o C] Figure 10 ...

Page 5

... Unclamped Inductive Switching Test Circuit & Waveforms FDD3N40 / FDU3N40 Rev. A Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms 5 www.fairchildsemi.com ...

Page 6

... FDD3N40 / FDU3N40 Rev. A Peak Diode Recovery dv/dt Test Circuit & Waveforms 6 www.fairchildsemi.com ...

Page 7

... Mechanical Dimensions FDD3N40 / FDU3N40 Rev. A D-PAK 7 www.fairchildsemi.com ...

Page 8

... Mechanical Dimensions FDD3N40 / FDU3N40 Rev. A I-PAK 8 www.fairchildsemi.com ...

Page 9

... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ® ACEx Across the board. Around the world.™ ActiveArray™ Bottomless™ Build it Now™ CoolFET™ ...

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