HY27SS08561M Hynix Semiconductor, HY27SS08561M Datasheet - Page 26

• Manufacturer Part Number: HY27SS08561M
• Description: 256mbit 32mx8bit / 16mx16bit Nand Flash
• Manufacturer: Hynix Semiconductor

Table 11: Operating and AC Measurement Conditions
Note : (1). TBD
Table 12: Capacitance
Note: T
Rev 0.7 / Oct. 2004
Load Capacitance (C
Symbol
Input and Output Timing Ref. Voltages
C
C
I/O
A
IN
= 25
Ambient Temperature (T
o
Input Pulses Voltages
Supply Voltage (V
C , f = 1 MHz. C
Input Capacitance
Input/Output Capacitance
L
) (1 TTL GATE and C
Input Rise and Fall Times
IN
Parameter
CC
and C
)
Parameter
A
)
I/O
are not 100% tested.
L
)
1.8V devices
2.6V devices
3.3V devices
Commercial Temp.
Indurstrial Temp.
1.8V devices
2.6V devices
3.3V devices
1.8V devices
2.6V devices
3.3V devices
1.8V devices
2.6V devices
3.3V devices
256Mbit (32Mx8bit / 16Mx16bit) NAND Flash
Test Condition
(1)
(1)
(1)
(1)
V
V
IN
IL
= 0V
= 0V
HY27US(08/16)561M Series
HY27SS(08/16)561M Series
Min
1.7
2.4
2.7
-40
0.4
Typ
0
0
0
NAND Flash
V
100
1.5
CC
30
30
5
/2
Max
1.95
V
V
2.8
3.6
2.4
70
85
Max
CC
CC
10
10
Unit
o
o
pF
pF
pF
Unit
ns
V
V
V
V
V
V
V
V
V
C
C
pF
pF
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