SCAN182541ASSCX Fairchild Semiconductor, SCAN182541ASSCX Datasheet

IC LINE DRIVER NON-INV 56SSOP

SCAN182541ASSCX

Manufacturer Part Number
SCAN182541ASSCX
Description
IC LINE DRIVER NON-INV 56SSOP
Manufacturer
Fairchild Semiconductor
Series
18000r
Datasheet

Specifications of SCAN182541ASSCX

Logic Type
Buffer/Line Driver, Non-Inverting
Number Of Elements
2
Number Of Bits Per Element
8
Current - Output High, Low
32mA, 15mA
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
56-SSOP
Logic Family
SCAN
Number Of Channels Per Chip
18
Polarity
Non-Inverting
Supply Voltage (max)
5.5 V
Supply Voltage (min)
4.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
High Level Output Current
- 32 mA
Low Level Output Current
15 mA
Minimum Operating Temperature
- 40 C
Number Of Lines (input / Output)
18 / 18
Output Type
3-State
Propagation Delay Time
6.5 ns at 5 V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
© 2000 Fairchild Semiconductor Corporation
SCAN18541TSSC
SCAN18541T
Non-Inverting Line Driver with 3-STATE Outputs
General Description
The SCAN18541T is a high speed, low-power line driver
featuring separate data inputs organized into dual 9-bit
bytes with byte-oriented paired output enable control sig-
nals. This device is compliant with IEEE 1149.1 Standard
Test Access Port and Boundary Scan Architecture with the
incorporation of the defined boundary-scan test logic and
test access port consisting of Test Data Input (TDI), Test
Data Out (TDO), Test Mode Select (TMS), and Test Clock
(TCK).
Ordering Code:
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Order Number
Package Number
MS56A
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
DS010965
Features
Pin Names
Truth Tables
H
L
AI
BI
AOE
BOE
AO
AO
Pin Names
(0–8)
(0–8)
IEEE 1149.1 (JTAG) Compliant
Dual output enable signals per byte
3-STATE outputs for bus-oriented applications
9-bit data busses for parity applications
Reduced-swing outputs source 32 mA/sink 64 mA
Guaranteed to drive 50
levels of 0.8V and 2.0V
TTL compatible inputs
25 mil pitch SSOP (Shrink Small Outline Package)
Includes CLAMP and HIGHZ instructions
Member of Fairchild’s SCAN Products
LOW Voltage Level
HIGH Voltage Level
(0–8)
(0–8)
AOE
BOE
1
1
, AOE
, BOE
H
H
L
X
L
L
X
L
Package Description
1
1
2
2
Input Pins, A Side
Input Pins, B Side
3-STATE Output Enable Input Pins,
3-STATE Output Enable Input Pins,
Output Pins, A Side
Output Pins, B Side
Inputs
Inputs
AOE
BOE
X
H
X
H
L
L
L
L
X
Z
2
2
High Impedance
Immaterial
transmission line to TTL input
October 1991
Revised April 2000
Description
AI
BI
(0–8)
H
(0–8)
H
X
X
X
X
L
L
www.fairchildsemi.com
AO
BO
H
H
Z
Z
L
Z
Z
L
A Side
B Side
(0–8)
(0–8)

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SCAN182541ASSCX Summary of contents

Page 1

... Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram © 2000 Fairchild Semiconductor Corporation Features IEEE 1149.1 (JTAG) Compliant Dual output enable signals per byte ...

Page 2

Block Diagrams Note: BSR stands for Boundary Scan Register. www.fairchildsemi.com Byte A Tap Controller Byte B 2 ...

Page 3

Description of Boundary-Scan Circuitry The scan cells used in the BOUNDARY-SCAN register are one of the following two types depending upon their loca- tion. Scan cell TYPE1 is intended to solely observe system data, while TYPE2 has the additional ability ...

Page 4

Description of Boundary-Scan Circuitry Scan Chain Definition (42 Bits in Length) www.fairchildsemi.com (Continued) Boundary-Scan Register 4 ...

Page 5

Description of Boundary-Scan Circuitry Boundary-Scan Register Definition Index Bit No. Pin Name 41 AOE 1 40 AOE 2 39 AOE 38 BOE 1 37 BOE 2 36 BOE ...

Page 6

Absolute Maximum Ratings Supply Voltage ( Input Diode Current ( 0. 0. Output Diode Current ( 0. 0. Output ...

Page 7

DC Electrical Characteristics Symbol Parameter I Maximum I CCt CC Per Input Note 2: Maximum test duration 2.0 ms, one output loaded at a time. Note 3: All outputs loaded; thresholds associated with output under test. Noise Specifications Symbol Parameter ...

Page 8

AC Electrical Characteristics Scan Test Operation: Symbol Parameter t , Propagation Delay PLH t TCK to TDO PHL t , Disable Time PLZ t TCK to TDO PHZ t , Enable Time PZL t TCK to TDO PZH t , ...

Page 9

AC Operating Requirements Scan Test Operation: Symbol Parameter t Setup Time Data to TCK (Note 11) t Hold Time TCK to Data (Note 11) t Setup Time AOE ...

Page 10

Extended AC Electrical Characteristics Symbol Parameter t , Propagation Delay PLH t Data to Output PHL t , Output Enable Time PZH t PZL t , Output Disable Time PHZ t PLZ t Pin to Pin Skew OSHL (Note 18) ...

Page 11

Physical Dimensions inches (millimeters) unless otherwise noted 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right ...

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