MT9M019 Aptina Imaging Corporation, MT9M019 Datasheet - Page 38

• Manufacturer Part Number: MT9M019
• Description: 1/5-Inch 1.3Mp CMOS Digital Image Sensor
• Manufacturer: Aptina Imaging Corporation

Sensor Core Digital Data Path
Test Patterns
Table 14:
Effect of Data Path Processing on Test Patterns
PDF: 7723845879/Source:2828556980
MT9D019_DS - Rev. F 5/10 EN
Test Patterns
The MT9M019 supports a number of test patterns to facilitate system debug. Test
patterns are enabled using test_pattern_mode (R0x0600–1). The test patterns are listed
in Table 14.
Test patterns 0–3 replace pixel data in the output image (the embedded data rows are
still present). Test pattern 4 replaces all data in the output image (the embedded data
rows are omitted and test pattern data replaces the pixel data).
For all of the test patterns, the MT9M019 registers must be set appropriately to control
the frame rate and output timing. This includes:
• All clock divisors
• x_addr_start
• x_addr_end
• y_addr_start
• y_addr_end
• frame_length_lines
• line_length_pck
• x_output_size
• y_output_size
Test patterns 1–3 are introduced early in the pixel data path. As a result, they are affected
by pixel processing that occurs within the data path. This includes:
• Noise cancellation
• Black pedestal adjustment
• Dark current compensation
These effects can be eliminated by the following register settings:
• R0x3044–5[10] = 0
• R0x30CA–B[0] = 1
• R0x30CC–D = 0
• R0x30CE–F = 0
• R0x30D0–1 = 0
• R0x30D2–3 = 0
• R0x30C0–1[0] = 0
• R0x30C2–3 = 0
• R0x30C4–5 = 0
• R0x30C6–7 = 0
Test_Pattern_Mode
0
1
2
3
4
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MT9M019: 1/5-Inch 1.3Mp CMOS Digital Image Sensor
Normal operation: no test pattern
PN9 link integrity pattern
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Sensor Core Digital Data Path
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