fin12a Fairchild Semiconductor, fin12a Datasheet - Page 12

• Manufacturer Part Number: fin12a
• Description: Fin12a Mserdes Low Voltage 12-bit Bi-directional Serializer/deserializer With Multiple Frequency Ranges Preliminary
• Manufacturer: Fairchild Semiconductor

www.fairchildsemi.com
I
I
I
I
I
I
I
I
I
t
f
t
t
t
t
t
f
Power Supply Currents
DDA1
DDA2
DDS1
DDS2
DDS
DD_PD
DD_SER1
DD_DES1
DD_SER2
Note 5: The worst case test pattern produces a maximum toggling of internal digital circuits, LpLVDS I/O and LVCMOS I/O with the PLL operating at the ref-
erence frequency unless otherwise specified. Maximum power is measured at the maximum V
values. Typical values are measured at V
AC Specification: Serializer Timing Characteristics
Over supply voltage and operating temperature ranges, unless otherwise specified.
TCP
REF
TCH
TCL
CLKT
TCH
TCL
MAX
Symbol
Symbol
V
Supply Current
V
Supply Current
V
Supply Current
V
Supply Current
V
Supply Current
V
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14:1 Dynamic Serializer
Power Supply Current
(Note 3)
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14:1 Dynamic Deserializer
Power Supply Current
(Note 5)
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14:1 Dynamic Serializer
Power Supply Current
(Note 5)
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CKREF Clock Period
(5 MHz - 56MHz)
CKREF Frequency Relative
to Strobe Frequency
CKREF Clock High Time
CKREF Clock Low Time
LVCMOS Input Transition Time
STROBE Pulse Width HIGH
STROBE Pulse Width LOW
Maximum
Serial Data Rate
DD_PD
DD_SER1
DD_DES1
DD_SER2
DDA
DDA
DDS
DDS
DDA
DD
Power-Down Supply Current
Serializer Static
Deserializer Static
Serializer Static
Deserializer Static
Static
I
DDA
I
I
I
Parameter
DDA
DDA
DDA
Parameter

I



DDS
I
I
I
DDS
DDS
DDS

I



DDP
I
I
I
DD
DDP
DDP
DDP
2.5V.
All DP and Control Inputs at 0V or V
NOCKREF, S2
All DP and Control Inputs at 0V or V
NOCKREF, S2
All DP and Control Inputs at 0V or V
NOCKREF, S2
All DP and Control Inputs at 0V or V
NOCKREF, S2
All DP and Control Inputs at 0V or V
S1
S1
All Inputs at GND or V
CKREF
DIRI
See Figure 14
CKREF
DIRI
See Figure 14
NOCKREF
STROBE
CKSI
DIRI
See Figure 14
See Figure 18
CKREF
CKREF
Does Not Equal
STROBE
Figure 18
Figure 18
Figure 18
REFCK x 14
S2
S2
Test Conditions
H
L
H
8X STROBE
o
STROBE
STROBE
0
0,
STROBE
Active
Test Conditions
0, S1
0, S1
0, S1
0, S1
DD
12
1, DIR
1, DIR
1, DIR
1, DIR
S2
S1
S2
S1
S2
S1
S2
S1
S2
S1
S2
S1
S2
S2
S2
S2
S2
S2
S2
S2
S2
1
0
1
0
H 5 MHz
H 10 MHz
H 30 MHz
H 56 MHz
H 5 MHz
H 10 MHz
H 30 MHz
H 56 MHz
L 15 MHz
L 30 MHz
L 15 MHz
L 30 MHz
1 S1
1 S1
0 S1
1 S1
1 S1
0 S1
0 S1
1 S1
1 S1
DD
DD
DD
DD
DD
DD
5 MHz
15 MHz
10 MHz
30 MHz
56 MHz
values. Minimum values are measured at the minimum V
0
1
1
0
1
1
1
0
1
1.1 *f
66.0
33.0
17.8
TBD
TBD
70.0
Min
140
420
Min
5.0
5.0
ST
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
Typ
Typ
0.5
0.5
T
Preliminary
TBD
TBD
TBD
Max
33.0
15.0
30.0
56.0
Max
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
166
100
210
420
784
5.0
Units
Units
Mb/s
MHz
mA
mA
mA
mA
mA
mA
mA
mA
ns
ns
ns
ns
uA
T
T
DD