f25l008a Elite Semiconductor Memory Technology Inc., f25l008a Datasheet

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f25l008a

Manufacturer Part Number
f25l008a
Description
3v Only Serial Flash Memory
Manufacturer
Elite Semiconductor Memory Technology Inc.
Datasheet

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
f25l008a-100PAG
Manufacturer:
ESMT
Quantity:
20 000
ESMT
ORDERING INFORMATION
F25L008A –50PAG
F25L008A –100PAG 100MHz 8 lead SOIC
F25L008A –50DG
F25L008A –100DG
GENERAL DESCRIPTION
The F25L008A is a 8Megablt, 3V only CMOS Serial Flash
memory device organized as 1M bytes of 8 bits. This device is
packaged in 8-lead SOIC 200mil. ESMT’s memory devices
reliably store memory data even after 100,000 program and
erase cycles.
The F25L008A features a sector erase architecture. The device
memory array is divided into 256 uniform sectors with 4K byte
each ; 16 uniform blocks with 64K byte each. Sectors can be
Elite Semiconductor Memory Technology Inc.
FEATURES
- Read max frequency : 33MHz
- Fast Read max frequency : 50MHz; 100MHz
- typical active current
- 15 μ A typical standby current
- 100,000 typical program/erase cycles
- 20 years Data Retention
- Byte program time 7 μ s(typical)
- Chip erase time 8s(typical)
- Block erase time 1sec (typical)
- Sector erase time 90ms (typical)
Single supply voltage 2.7~3.6V
Speed
Low power consumption
Reliability
Program
Erase
Part No.
100MHz 8 lead PDIP
50MHz
50MHz
Speed
8 lead SOIC
8 lead PDIP
Package
200mil
200mil
300mil
300mil
COMMENTS
Pb-free
Pb-free
Pb-free
Pb-free
erased individually without affecting the data in other sectors.
Blocks can be erased individually without affecting the data in
other blocks. Whole chip erase capabilities provide the flexibility
to revise the data in the device.
The sector protect/unprotect feature disables both program and
erase operations in any combination of the sectors of the
memory.
- Decrease total chip programming time over
- SPI Compatible : Mode 0 and Mode3
Auto Address Increment (AAI) WORD Programming
SPI Serial Interface
End of program or erase detection
Write Protect ( WP )
Hold Pin ( HOLD )
All Pb-free products are RoHS-Compliant
Byte-Program operations
8Mbit (1Mx8)
3V Only Serial Flash Memory
Publication Date: Jul. 2008
Revision:
1.6
F25L008A
1/32

Related parts for f25l008a

f25l008a Summary of contents

Page 1

... F25L008A –100DG 100MHz 8 lead PDIP GENERAL DESCRIPTION The F25L008A is a 8Megablt, 3V only CMOS Serial Flash memory device organized as 1M bytes of 8 bits. This device is packaged in 8-lead SOIC 200mil. ESMT’s memory devices reliably store memory data even after 100,000 program and erase cycles ...

Page 2

... ESMT PIN CONFIGURATIONS 8-PIN SOIC VSS 4 8-PIN PDIP VSS 4 Elite Semiconductor Memory Technology Inc. 8 VDD HOLD 7 SCK VDD HOLD 7 SCK Publication Date: Jul. 2008 Revision: F25L008A 1.6 2/32 ...

Page 3

... Data is shifted out on the falling edge of SCK. To activate the device when CE is low. The Write Protect ( WP ) pin is used to enable/disable BPL bit in the status register. To temporality stop serial communication with SPI flash memory without resetting the device. To provide power. F25L008A Publication Date: Jul. 2008 Revision: 1.6 3/32 ...

Page 4

... ESMT SECTOR STRUCTURE Table1 : F25L008A Sector Address Table Sector Size Sector Block (Kbytes) 255 4KB 240 4KB 239 4KB 224 4KB 223 4KB 208 4KB 207 4KB 192 4KB 191 4KB 176 4KB 175 4KB 160 4KB 159 4KB 144 4KB ...

Page 5

... Table2 : F25L008A Block Protection Table Protection Level BP2 0 Upper 1/16 Upper 1/8 Upper 1/4 Upper 1/2 All Blocks All Blocks All Blocks Block Protection (BP2, BP1, BP0) The Block-Protection (BP2, BP1, BP0) bits define the size of the memory area, as defined in Table2 to be software protected against any memory Write (Program or Erase) operations ...

Page 6

... ESMT FUNTIONAL BLOCK DIAGRAM Address Buffers and Latches CE Elite Semiconductor Memory Technology Inc. X-Decoder Y-Decoder I/O Butters Control Logic Data Latches Serial Interface SCK HOLD F25L008A Flash and Publication Date: Jul. 2008 Revision: 1.6 6/32 ...

Page 7

... ctive Figure 1 : HOLD CONDITION WAVEFORM Write Protection F25L008A provides software Write protection. The Write Protect pin ( WP ) enables or disables the lockdown function of the status register. The Block-Protection bits (BP1, BP0, and BPL) in the status register provide Write protection to the memory array and the status register. See Table 5 for Block-Protection description ...

Page 8

... Table 4 describes the function of each bit in the software status register. Function accept any memory Write (Program/ Erase) commands. The Write-Enable-Latch bit is automatically reset under the following conditions: F25L008A Default at Read/Write Power- ...

Page 9

... ESMT Instructions Instructions are used to Read, Write (Erase and Program), and configure the F25L008A. The instruction bus cycles are 8 bits each for commands (Op Code), data, and addresses. Prior to executing any Byte-Program, Sector-Erase, Block-Erase, or Chip-Erase instructions, the Write-Enable (WREN) instruction must be executed first. The complete list of the instructions is provided in Table 5 ...

Page 10

... The Read instruction is initiated by executing an 8-bit command, 03H, followed by address bits [A low for the duration of the Read cycle. See Figure 2 for the Read sequence ADD. ADD. ADD. MSB N D OUT MSB F25L008A - must remain active N+1 N+2 N+3 N ...

Page 11

... FFFFFH has been read, the next output will be from address location 000000H ADD. ADD. ADD. X MSB MSB F25L008A is reached, the address N+1 N+2 N+3 N ...

Page 12

... Busy bit in the software status register or wait TBP for the completion of the internal self-timed Byte-Program operation. See Figure 4 for the Byte-Program sequence ADD. ADD. MSB HIGH IMPENANCE F25L008A -A ]. Following the address, the data ADD. D ...

Page 13

... DURING AAI PROGRAMMING Elite Semiconductor Memory Technology Inc Following the addresses, two bytes of data is input sequentially FIGURE 9 : DISABLE SO AS HARDWARE DURING AAI PROGRAMMING F25L008A . Refer to End-of-Write with A =1. CE must be driven The hardware end of write detection BP. ...

Page 14

... ESMT FIGURE 10 : AUTO ADDRESS INCREMENT (AAI) WORD-PROGRAM SEQUENCE WITH HARDWARE END-OF-WRITE DETETION FIGURE 11 : AUTO ADDRESS INCREMENT (AAI) WORD-PROGRAM SEQUENCE WITH SOFTWARE END-OF-WRITE DETETION Elite Semiconductor Memory Technology Inc. F25L008A Publication Date: Jul. 2008 Revision: 1.6 14/32 ...

Page 15

... VIL or VIH. CE must be driven high before the instruction is executed. The user may poll the Busy bit in the software status register or wait TBE for the completion of the internal self-timed Block-Erase cycle. See Figure 5 for the Block-Erase sequence. Publication Date: Jul. 2008 Revision: F25L008A = Most Significant address) ), remaining X 1.6 15/32 ...

Page 16

... Sector-Erase cycle. See Figure 6 for the Sector-Erase sequence Address bits ADD. MSB MSB HIGH IMPENANCE F25L008A ] (A = Most Significant address) are used to determine remaining address bits can be VIL ADD. ADD. Publication Date: Jul. 2008 Revision: 1 ...

Page 17

... Read-Status-Register is continuous with ongoing clock cycles until it is terminated by a low to high transition of the CE See Figure 8 for the RDSR instruction sequence Bit7 MSB F25L008A for the completion of the internal self-timed remain low until the status ...

Page 18

... CE must be driven high before the WRDI instruction is executed. Figure 10 : WRITE DISABLE (WRDI) SEQUENCE Elite Semiconductor Memory Technology Inc MODE3 SCK MODE0 06 SI MSB HIGH IMPENANCE MODE3 SCK MODE0 04 SI MSB HIGH IMPENANCE SO F25L008A Publication Date: Jul. 2008 Revision: 1.6 18/32 ...

Page 19

... BP0 ;BP1 and BP2 bits at the same time. See Table 3 for a summary description of WP and BPL functions 1011 12 13 1415 MSB HIGH IMPENANCE F25L008A ) prior to the low-to-high transition of the IH STATUS REGISTER Publication Date: Jul ...

Page 20

... µA V OUT 0 =100 µ -0.2 0 =-100 µ Parameter Description F25L008A Test Conditions /0.9 V @33 MHz, SO=open VIN Max =GND Max Min DD =V Max ...

Page 21

... Erase, Program or WRSR cycle is in progress is no decoded, and has no effect on the cycle in progress. CE MODE3 0 1 SCK MODE1 SI MSB HIGH IMPENANCE SO Figure 12 : Read-Electronic-Signature (RES) Elite Semiconductor Memory Technology Inc Bit7 MSB Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 Status Register Out Publication Date: Jul. 2008 Revision: 1.6 F25L008A 21/32 ...

Page 22

... After that, a 16-bit device ID is shifted out on the SO pin. Byte1, BFH, identifies the manufacturer as ESMT. Byte2, 20H, identifies the memory type as SPI Flash. Byte3, 14H, identifies the device as F25L008A. The instruction sequence is shown in Figure13. The JEDEC Read ID instruction is terminated by a low to high transition any time during data output other command is ...

Page 23

... ESMT Read-ID (RDID) The Read-ID instruction (RDID) identifies the devices as F25L008A and manufacturer as ESMT. This command is backward compatible to all ESMT SPI devices and should be used as default device identification when multiple versions of ESMT SPI devices are used in one design. The device information can be read from executing an 8-bit command, 90H or ABH, followed by address bits [A Following the Read-ID instruction, the manufacturer’ ...

Page 24

... F25L008A Units Test Method Cycles JEDEC Standard A117 Years JEDEC Standard A103 mA JEDEC Standard 78 Max Units 100 MHz ...

Page 25

... Tested, Excludes external system level over head. 2.Typical values measured at 25°C, 3V. 3.Maximum values measured at 85°C, 2.7V. Elite Semiconductor Memory Technology Inc. Limits Unit Typ.(2) Max.(3) 90 200 100 100,000 - Cycles 20 - Years F25L008A Publication Date: Jul. 2008 Revision: 1.6 25/32 ...

Page 26

... ESMT FIGURE 15: SERIAL INPUT TIMING DIAGRAM FIGURE 16: SERIAL OUTPUT TIMING DIAGRAM Elite Semiconductor Memory Technology Inc. F25L008A Publication Date: Jul. 2008 Revision: 1.6 26/32 ...

Page 27

... ESMT FIGURE 17: HOLD TIMING DIAGRAM FIGURE 18: POWER-UP TIMING DIAGRAM Elite Semiconductor Memory Technology Inc. F25L008A Publication Date: Jul. 2008 Revision: 1.6 27/32 ...

Page 28

... FIGURE INPUT/OUTPUT REFERENCE WAVEFORMS FIGURE 20: A TEST LOAD EXAMPLE Elite Semiconductor Memory Technology Inc. 0.7VCC AC Measurement Level 0.3VCC Note : Input pulse rise and fall time are <5ns F25L008A Output timing reference level 0.5VCC Publication Date: Jul. 2008 Revision: 1.6 28/32 ...

Page 29

... E 0.002 0.006 0.010 E 1 0.067 0.071 0.075 L 0.014 0.016 0.020 e 0.007 0.008 0.010 L 1 θ 0.202 0.206 0.210 F25L008A L L1 DETAIL "X" Dimension in mm Dimension in inch Min Norm Max Min Norm 7.70 7.90 8.10 0.303 0.311 5.18 5.28 5.38 0.204 0.208 0.50 0.65 0.80 0.020 0.026 1 ...

Page 30

... Min Norm Max 5.00 0.38 3.18 3.30 3.43 9.02 9.27 10.16 7.62 BSC. 6.22 6.35 6.48 9.02 9.27 10.16 2.54 TYP. 8.51 9.02 9.53 0.46 TYP. 1.52 TYP F25L008A 0 Dimension in inch Min Norm Max 0.21 0.015 0.125 0.130 0.135 0.355 0.365 0.400 0.300 BSC. 0.245 0.250 0.255 0.115 0.130 0.150 0.100 TYP. 0.335 0.355 0.375 0.018 TYP. 0.060 TYP ...

Page 31

... AAI function use 1 word Din (Page8) 1. Correct Byte Program Time. 2007.04.04 2. Modify ordering information. 1. Add “All Pb-free products are ROHS-Compliant” in the description of features 2008.07.17 2. Delete bottom block protection table 3. Modify tSE timing 4. Add Revision History F25L008A Description Publication Date: Jul. 2008 Revision: 1.6 31/32 ...

Page 32

... If products described here are to be used for such kinds of application, purchaser must do its own quality assurance testing appropriate to such applications. Elite Semiconductor Memory Technology Inc. Important Notice F25L008A Publication Date: Jul. 2008 Revision: 1.6 32/32 ...

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