ADF4157 AD [Analog Devices], ADF4157 Datasheet - Page 16

• Manufacturer Part Number: ADF4157
• Description: High Resolution 6 GHz Fractional-N Frequency Synthesizer
• Manufacturer: AD [Analog Devices]

ADF4157
TEST REGISTER (R4) MAP
With R3[2, 1, 0] set to [1, 0, 0], the on-chip test register (R4) is
programmed as shown in Figure 21.
DB31
0
DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
0
0
0
0
0
0
0
0
0
0
0
SET THESE BITS TO 0
0
Figure 21. Test Register (R4) Map
RESERVED
0
Rev. 0 | Page 16 of 20
0
0
0
Reserved Bits
DB[31:3] should be set to 0 in this register.
0
0
0
0
0
0
0
0
0
0
0
0
C3(1) C2(0) C1(0)
CONTROL
BITS