PEB20534H-10 SIEMENS [Siemens Semiconductor Group], PEB20534H-10 Datasheet - Page 404

• Manufacturer Part Number: PEB20534H-10
• Description: DMA Supported Serial Communication Controller with 4 Channels DSCC4
• Manufacturer: SIEMENS [Siemens Semiconductor Group]

Semiconductor Group
Seq.
No.
117
118
119
120
121
122
123
124
125
126
An input pin (I) uses one boundary scan cell (data in), an output pin (O) uses two cells
(data out, enable) and an I/O-pin (I/O) uses three cells (data in, data out, enable). Note
that some functional output and input pins of the DSCC4 are tested as I/O pins in
boundary scan, hence using three cells. The boundary scan unit of the DSCC4 contains
a total of n = 374 scan cells.
The right column of table 108 gives the initialization values of the cells.
The desired test mode is selected by serially loading a 3-bit instruction code into the
instruction register via TDI (LSB first); see table 109.
Table 109
Instruction (Bit 2 … 0)
000
001
010
011
111
others
EXTEST is used to examine the interconnection of the devices on the board. In this test
mode at first all input pins capture the current level on the corresponding external
interconnection line, whereas all output pins are held at constant values (‘0’ or ‘1’,
Pin
TXCLK1
RXCLK1
TEST1
RTS0
CD0
CTS0
TXD0
RXD0
TXCLK0
RXCLK0
-> TDO
Boundary Scan Test Modes
I/O
I/O
I/O
I
I/O
I/O
I/O
I/O
I/O
I/O
I/O
Test Mode
EXTEST (external testing)
INTEST (internal testing)
SAMPLE/PRELOAD (snap-shot testing)
IDCODE (reading ID code)
BYPASS (bypass operation)
handled like BYPASS
Number of
Boundary Scan Cells
3
3
1
3
3
3
3
3
3
3
404
Constant Value
In, Out, Enable
000
000
0
000
000
000
000
000
000
000
Test Configuration
Data Sheet 09.98
PEB 20534