FDS8333C Fairchild Semiconductor, FDS8333C Datasheet - Page 2

MOSFET N/P-CH 30V 4.1/3.4A 8SOIC

FDS8333C

Manufacturer Part Number
FDS8333C
Description
MOSFET N/P-CH 30V 4.1/3.4A 8SOIC
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet

Specifications of FDS8333C

Fet Type
N and P-Channel
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
80 mOhm @ 4.1A, 10V
Drain To Source Voltage (vdss)
30V
Current - Continuous Drain (id) @ 25° C
4.1A, 3.4A
Vgs(th) (max) @ Id
3V @ 250µA
Gate Charge (qg) @ Vgs
6.6nC @ 4.5V
Input Capacitance (ciss) @ Vds
282pF @ 10V
Power - Max
900mW
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Configuration
Dual Dual Drain
Transistor Polarity
N and P-Channel
Resistance Drain-source Rds (on)
0.08 Ohm @ 10 V @ N Channel
Forward Transconductance Gfs (max / Min)
5 S
Drain-source Breakdown Voltage
30 V
Gate-source Breakdown Voltage
+/- 16 V @ N Channel or +/- 20 V @ P Channel
Continuous Drain Current
4.1 A @ N Channel or 3.4 A @ P Channel
Power Dissipation
2000 mW
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
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Manufacturer
Quantity
Price
Part Number:
FDS8333C
Manufacturer:
STM
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7 013
Part Number:
FDS8333C
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
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Part Number:
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Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Lot
Q20070231AAACLV
Q20070231BAACLV
Q20070231CAACLV
Q20070231DAACLV
Test: (High Temperature Gate Bias)
Lot
Q20070231AAHTGB
Q20070231BAHTGB
Q20070231CAHTGB
Q20070231DAHTGB
Test: (High Temperature Reverse Bias)
Lot
Q20070231AAHTRB
Q20070231BAHTRB
Q20070231CAHTRB
Q20070231DAHTRB
Test: (Power Cycle)
Lot
Q20070231AAPRCL
Q20070231AAPRCL
Q20070231BAPRCL
Q20070231BAPRCL
Q20070231CAPRCL
Q20070231CAPRCL
Q20070231DAPRCL
Q20070231DAPRCL
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070231AATMCL1
Q20070231AATMCL1
Q20070231BATMCL1
Q20070231BATMCL1
Q20070231CATMCL1
Q20070231CATMCL1
Q20070231DATMCL1
Q20070231DATMCL1
Test: 130C (Highly Accelerated Stress Test)
Lot
Q20070231AAHAST1
Q20070231BAHAST1
Q20070231CAHAST1
Q20070231DAHAST1
Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition)
Lot
Q20070231AAPCNL1A
Q20070231BAPCNL1A
Q20070231CAPCNL1A
Q20070231DAPCNL1A
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
168-HOURS
0/77
0/77
0/77
0/77
168-HOURS
0/77
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
0/77
100-CYCLES
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
Results
0/231
0/231
0/231
0/231
10000-CYCLES
0/77
0/77
0/77
0/77
500-CYCLES
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 2

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