FDS2670 Fairchild Semiconductor, FDS2670 Datasheet

MOSFET N-CH 200V 3A SO-8

FDS2670

Manufacturer Part Number
FDS2670
Description
MOSFET N-CH 200V 3A SO-8
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet

Specifications of FDS2670

Fet Type
MOSFET N-Channel, Metal Oxide
Fet Feature
Standard
Rds On (max) @ Id, Vgs
130 mOhm @ 3A, 10V
Drain To Source Voltage (vdss)
200V
Current - Continuous Drain (id) @ 25° C
3A
Vgs(th) (max) @ Id
4.5V @ 250µA
Gate Charge (qg) @ Vgs
43nC @ 10V
Input Capacitance (ciss) @ Vds
1228pF @ 100V
Power - Max
1W
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Configuration
Single Quad Drain Triple Source
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.13 Ohms
Forward Transconductance Gfs (max / Min)
15 S
Drain-source Breakdown Voltage
200 V
Gate-source Breakdown Voltage
+/- 20 V
Continuous Drain Current
3 A
Power Dissipation
2.5 W
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDS2670
FDS2670TR

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FDS2670
Quantity:
7 690
Part Number:
FDS2670
Manufacturer:
FSC
Quantity:
144
Part Number:
FDS2670
Manufacturer:
FIARCHILD
Quantity:
20 000
Company:
Part Number:
FDS2670
Quantity:
135
Company:
Part Number:
FDS2670
Quantity:
1 600
Part Number:
FDS2670-NL
Manufacturer:
FSC
Quantity:
40 000
Part Number:
FDS2670-NL
Manufacturer:
FAIRCHILD
Quantity:
5 000
Part Number:
FDS2670_NL
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Final PCN Q3073705 is an addendum for Final PCN Q1070805.
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Kalabkova, Ivana
E-mail: Ivana.Kalabkova@notes.fairchildsemi.com
Phone: 408-822-2187
Implementation of change:
Expected 1st Device Shipment Date: 2007/12/10
Earliest Year/Work Week of Changed Product: 0750
Change Type Description: Bond Wire Material Composition
Description of Change (From): Wirebond material using 2mil Gold (Au) wire for SO8 devices
manufactured in subcontractor site, GEM Electronics Ltd Shanghai China.
Description of Change (To): Wirebond material using 2mil Copper (Cu) wire for SO8 devices
manufactured in subcontractor site, GEM Electronics Ltd Shanghai China.
Reason for Change : Qualification of GEM as alternate site for Cu wire bonded parts for SO-8.
Products will be shipped for an interim period of time with Au wire until the inventory is
depleted and then converted to Cu wire. GEM Electronics Ltd., Shanghai China is TS-16949
certified.
Qual/REL Plan Numbers : Q20070231
Qualification :
This change will have no impact on any of the electrical parameters of the products
involved. The product test conditions, test limits and performance will remain
unchanged. Products will be built with the same level of quality and reliability as with
the existing products. The devices for qualification and qualification requirements are
defined in the table below.
Results/Discussion
Test: (Autoclave)
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: Rivero, Douglas
E-mail: Doug.Rivero@fairchildsemi.com
Phone: 1-408-822-2143
Date Issued On : 2007/10/12
Date Created : 2007/09/11
PCN# : Q3073705
Pg. 1

Related parts for FDS2670

FDS2670 Summary of contents

Page 1

... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...

Page 2

Lot Device Q20070231AAACLV FDS6912A Q20070231BAACLV FDS3570 Q20070231CAACLV FDS3672 Q20070231DAACLV FDS8870 Test: (High Temperature Gate Bias) Lot Device Q20070231AAHTGB FDS6912A Q20070231BAHTGB FDS3570 Q20070231CAHTGB FDS3672 Q20070231DAHTGB FDS8870 Test: (High Temperature Reverse Bias) Lot Device Q20070231AAHTRB FDS6912A Q20070231BAHTRB FDS3570 Q20070231CAHTRB FDS3672 Q20070231DAHTRB FDS8870 ...

Page 3

... FDS6812A_NL FDS6890A_NF40 FDS6892A_NF40 FDS6894A_NL FDS6898A_F095 FDS6910_NF40 FDS6912A_NL FDS6961A_F011 FDS6961A_NL FDS6982_NL FDS8812NZ FDS8878_F095 FDS8962C_NL FDS9412_NL FDS9926A_NF40 FDS9933_NL FDS9953A_NL NDS8425_NL SI4542DY_NL FDS2572_NL FDS2670_NL FDS3601 FDS3672_NL FDS3812_NL FDS3992 FDS4435A_F095 FDS4470_NF40 FDS4480_NL FDS4885C_NF40 FDS4953_NF40 FDS5670_NL FDS5680_NL FDS5692Z FDS6375_NF40 FDS6575_NF40 FDS6609A_NL FDS6680A_F095 FDS6682_NL FDS6694_NF40 FDS6875_NF40 FDS6890A_NL ...

Related keywords