FDW262P Fairchild Semiconductor, FDW262P Datasheet
FDW262P
Specifications of FDW262P
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FDW262P Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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Change To Qualification Stress Test and Sample Size Detail Device #1 FDW2508PB Package: -1 #Leads: -1 Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard ACLV X JESD22-A102 100%RH, 121C 96 H3TRB X JESD22-A101B85%RH, 85C, HTGB ...
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... PRCL MIL- STD-750-1036 TMCL1 X JESD22-A104 -65C, 150C Product Id Description : Affected FSIDs : 5ES4_B5E012A FDW2501N_NBDE006A FDW2503NZ FDW2506P FDW2507NZ_NL FDW2508P_NBCP007A FDW2511NZ_NL FDW2521C FDW254P FDW256P FDW262P FDW9926A_NL SI6435DQ Readpoints Conditions TP1 TP2 168 500 80% of related BV 168 500 related VgsV 168 500 lated BV Delta 100C, 2 ...
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SI6955DQ Pg. 4 ...