BAS29_31_35 NXP Semiconductors, BAS29_31_35 Datasheet - Page 6

General purpose switching diodes fabricated in planartechnology, and encapsulated in small rectangular plasticSMD SOT23 packages

BAS29_31_35

Manufacturer Part Number
BAS29_31_35
Description
General purpose switching diodes fabricated in planartechnology, and encapsulated in small rectangular plasticSMD SOT23 packages
Manufacturer
NXP Semiconductors
Datasheet
NXP Semiconductors
2003 Mar 20
handbook, full pagewidth
handbook, halfpage
General purpose controlled avalanche
(double) diodes
(1) V
(2) V
Fig.5
(1) I
(µA)
10
10
V = V
10
I R
R
10
−1
−2
R
R
R = 50
2
1
= 3 mA.
S
= 90 V; maximum values.
= 90 V; typical values.
0
R
Reverse current as a function of junction
temperature.
I x R
F
S
(1)
100
(2)
I F
Fig.7 Reverse recovery voltage test circuit and waveforms.
D.U.T.
T j (
o
C)
OSCILLOSCOPE
SAMPLING
MBH282
R = 50
MGA881
i
200
V R
6
handbook, halfpage
10%
t r
f = 1 MHz; T
Fig.6
90%
(pF)
C d
input signal
40
30
20
10
0
0
t p
Diode capacitance as a function of reverse
voltage; typical values.
j
= 25 °C.
BAS29; BAS31; BAS35
10
t
I F
20
output signal
Product data sheet
V R (V)
t rr
MGD003
30
(1)
t

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