HGTP3N60A4D9A Fairchild Semiconductor, HGTP3N60A4D9A Datasheet

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HGTP3N60A4D9A

Manufacturer Part Number
HGTP3N60A4D9A
Description
600v, Smps Series N-channel Igbt With Anti-parallel Hyperfast Diode
Manufacturer
Fairchild Semiconductor
Datasheet

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Part Number:
HGTP3N60A4D9A
Manufacturer:
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Quantity:
12 500
©2001 Fairchild Semiconductor Corporation
600V, SMPS Series N-Channel IGBT with
Anti-Parallel Hyperfast Diode
The HGT1S3N60A4DS and the HGTP3N60A4D are MOS
gated high voltage switching devices combining the best
features of MOSFETs and bipolar transistors. These devices
have the high input impedance of a MOSFET and the low
on-state conduction loss of a bipolar transistor. The much
lower on-state voltage drop varies only moderately between
25
TA49327. The diode used in anti-parallel is the development
type TA49369.
This IGBT is ideal for many high voltage switching
applications operating at high frequencies where low
conduction losses are essential. This device has been
optimized for high frequency switch mode power
supplies.
Formerly Developmental Type TA49329.
Ordering Information
NOTE: When ordering, use the entire part number. Add the suffix 9A
to obtain the TO-263AB in tape and reel, i.e., HGT1S3N60A4DS9A.
Symbol
HGT1S3N60A4DS
HGTP3N60A4D
o
4,364,073
4,598,461
4,682,195
4,803,533
4,888,627
C and 150
PART NUMBER
Fairchild CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
o
C. The IGBT used is the development type
4,417,385
4,605,948
4,684,413
4,809,045
4,890,143
G
TO-263AB
TO-220AB
PACKAGE
C
E
4,430,792
4,620,211
4,694,313
4,809,047
4,901,127
Data Sheet
3N60A4D
3N60A4D
BRAND
4,443,931
4,631,564
4,717,679
4,810,665
4,904,609
HGT1S3N60A4DS, HGTP3N60A4D
4,466,176
4,639,754
4,743,952
4,823,176
4,933,740
Features
• >100kHz Operation At 390V, 3A
• 200kHz Operation At 390V, 2.5A
• 600V Switching SOA Capability
• Typical Fall Time . . . . . . . . . . . . . . . . . 70ns at T
• Low Conduction Loss
• Temperature Compensating SABER™ Model
Packaging
www.Fairchildsemi.com
December 2001
COLLECTOR
(FLANGE)
G
4,516,143
4,639,762
4,783,690
4,837,606
4,963,951
E
JEDEC TO-263AB
JEDEC TO-220AB
HGT1S3N60A4DS, HGTP3N60A4D Rev. B
4,532,534
4,641,162
4,794,432
4,860,080
4,969,027
COLLECTOR
(FLANGE)
E
C
4,587,713
4,644,637
4,801,986
4,883,767
G
J
= 125
o
C

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HGTP3N60A4D9A Summary of contents

Page 1

... Fairchild Semiconductor Corporation HGT1S3N60A4DS, HGTP3N60A4D December 2001 Features • >100kHz Operation At 390V, 3A • 200kHz Operation At 390V, 2.5A • 600V Switching SOA Capability • Typical Fall Time . . . . . . . . . . . . . . . . . 70ns at T • Low Conduction Loss • ...

Page 2

... On-State Gate Charge Current Turn-On Delay Time Current Rise Time Current Turn-Off Delay Time Current Fall Time Turn-On Energy (Note 2) Turn-On Energy (Note 2) Turn-Off Energy (Note 3) ©2001 Fairchild Semiconductor Corporation Unless Otherwise Specifi (Figure SSOA o C, Unless Otherwise Specified ...

Page 3

... Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss. Typical Performance Curves CASE TEMPERATURE ( C FIGURE 1. DC COLLECTOR CURRENT vs CASE TEMPERATURE ©2001 Fairchild Semiconductor Corporation o C, Unless Otherwise Specified (Continued) SYMBOL TEST CONDITIONS t IGBT and Diode at T d(ON 3A 390V 15V, ...

Page 4

... 12V 15V 160 120 COLLECTOR TO EMITTER CURRENT (A) CE FIGURE 7. TURN-ON ENERGY LOSS vs COLLECTOR TO EMITTER CURRENT ©2001 Fairchild Semiconductor Corporation Unless Otherwise Specified (Continued 15V 390V 150 ...

Page 5

... 125 GATE TO EMITTER VOLTAGE (V) GE FIGURE 13. TRANSFER CHARACTERISTIC ©2001 Fairchild Semiconductor Corporation Unless Otherwise Specified (Continued 125 12V 125 15V FIGURE 10. TURN-ON RISE TIME vs COLLECTOR 15V, T ...

Page 6

... FORWARD VOLTAGE (V) EC FIGURE 19. DIODE FORWARD CURRENT vs FORWARD VOLTAGE DROP ©2001 Fairchild Semiconductor Corporation Unless Otherwise Specified (Continued) = 15V GE 100 125 150 o C) FIGURE 16. TOTAL SWITCHING LOSS vs GATE RESISTANCE FREQUENCY = 1MHz 60 80 100 FIGURE 18. COLLECTOR TO EMITTER ON-STATE VOLTAGE ...

Page 7

... SINGLE PULSE - FIGURE 23. IGBT NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE Test Circuit and Waveforms L = 1mH R = 50Ω G FIGURE 24. INDUCTIVE SWITCHING TEST CIRCUIT ©2001 Fairchild Semiconductor Corporation Unless Otherwise Specified (Continued) 200 390V EC CE 160 120 o 125 ...

Page 8

... Gate Protection - These devices do not have an internal monolithic Zener diode from gate to emitter. If gate protection is required an external Zener is recommended. ©2001 Fairchild Semiconductor Corporation Operating Frequency Information Operating frequency information for a typical device (Figure 3) is presented as a guide for estimating device performance for a specifi ...

Page 9

... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ACEx™ FAST Bottomless™ FASTr™ FRFET™ CoolFET™ GlobalOptoisolator™ CROSSVOLT™ GTO™ DenseTrench™ ...

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