hy5du561622efp Hynix Semiconductor, hy5du561622efp Datasheet - Page 21

• Manufacturer Part Number: hy5du561622efp
• Description: 256mb Ddr Sdram
• Manufacturer: Hynix Semiconductor

Rev. 1.1 / June 2006
AC OPERATING CONDITIONS
Note:
1. VID is the magnitude of the difference between the input level on CK and the input on /CK.
2. The value of VIX is expected to equal 0.5*V DDQ of the transmitting device and must track variations in the DC level of the same.
*For more information about AC Overshoot/Undershoot Specifications, refer to “Device Operation” section in hynix website.
AC OPERATING TEST CONDITIONS
Input High (Logic 1) Voltage, DQ, DQS and DM signals
Input Low (Logic 0) Voltage, DQ, DQS and DM signals
Input Differential Voltage, CK and /CK inputs
Input Crossing Point Voltage, CK and /CK inputs
Reference Voltage
Termination Voltage
AC Input High Level Voltage (V
AC Input Low Level Voltage (V
Input Timing Measurement Reference Level Voltage
Output Timing Measurement Reference Level Voltage
Input Signal maximum peak swing
Input minimum Signal Slew Rate
Termination Resistor (R
Series Resistor (R
Output Load Capacitance for Access Time Measurement (C
S
)
Parameter
T
)
Parameter
IL
IH
, max)
, min)
1
2
(TA=0 to 70
(TA=0 to 70
L
)
o
Symbol
C, Voltage referenced to V
V
V
V
V
IH(AC)
ID(AC)
IX(AC)
IL(AC)
o
C, Voltage referenced to VSS = 0V)
0.5*V
V
REF
V
V
V
V
Min
REF
0.7
DDQ
DDQ
REF
DDQ
+ 0.31
-
Value
V
V
1.5
50
25
30
REF
+ 0.31
1
TT
- 0.31
-0.2
x 0.5
x 0.5
SS
= 0V)
HY5DU561622E(L)FP
HY5DU56822E(L)FP
0.5*V
V
V
DDQ
REF
Max
DDQ
-
- 0.31
+ 0.6
+0.2
Unit
V/ns
pF
W
Ω
V
V
V
V
V
V
V
Unit
V
V
V
V
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