M29W004B-100N1TR STMICROELECTRONICS [STMicroelectronics], M29W004B-100N1TR Datasheet - Page 12

• Manufacturer Part Number: M29W004B-100N1TR
• Description: 4 Mbit 512Kb x8, Boot Block Low Voltage Single Supply Flash Memory
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

M29W004T, M29W004B
Table 11. AC Measurement Conditions
Figure 4. AC Testing Input Output Waveform
Table 12. Capacitance
Note: 1. Sampled only, not 100% tested.
Table 13. DC Characteristics
(T
Note: 1. Sampled only, not 100% tested.
12/30
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Symbol
A
I
CC4
V
Symbol
I
I
I
V
V
= 0 to 70 C, –20 to 85 C or –40 to 85 C; V
V
V
I
V
CC1
CC1
CC3
I
I
LKO
LO
C
OH
ID
LI
OL
IH
ID
IL
C
3V
0V
OUT
(1)
IN
Input Leakage Current
Output Leakage Current
Supply Current (Read) Byte
Supply Current (Read) Word
Supply Current (Standby)
Supply Current (Program or Erase)
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage CMOS
A9 Voltage (Electronic Signature)
A9 Current (Electronic Signature)
Supply Voltage (Erase and
Program lock-out)
Input Capacitance
Output Capacitance
Parameter
Parameter
(1)
(T
A
= 25 C, f = 1 MHz )
0 to 3V
1.5V
AI01417
1.5V
10ns
E = V
E = V
CC
Byte program, Block or
Chip Erase in progress
Test Condition
= 2.7V to 3.6V)
V
0V
Test Condition
V
E = V
0V
IL
IL
OUT
I
, G = V
, G = V
OH
IN
I
OL
A9 = V
= 0V
= –100 A
V
= 0V
Figure 5. AC Testing Load Circuit
V
CC
OUT
= 4mA
IN
IH
IH
C L includes JIG capacitance
ID
, f = 6MHz
, f = 6MHz
0.2V
V
DEVICE
UNDER
V
TEST
CC
CC
Min
V
0.7 V
CC
–0.5
11.0
Min
2.0
–0.4V
0.8V
CC
1N914
3.3k
C L = 30pF or 100pF
Max
12
6
V
CC
Max
0.45
12.0
100
0.8
2.3
10
10
50
20
+ 0.3
1
1
OUT
AI01968
Unit
pF
pF
Unit
mA
mA
mA
V
V
V
V
V
V
A
A
A
A