ATMEGA2560R231-CU Atmel, ATMEGA2560R231-CU Datasheet - Page 297

• Manufacturer Part Number: ATMEGA2560R231-CU
• Description: BUNDLE ATMEGA2560/RF231 PBGA
• Manufacturer: Atmel

Specifications of ATMEGA2560R231-CU

• Frequency: 2.4GHz
• Modulation Or Protocol: 802.15.4 Zigbee, 6LoWPAN, RF4CE, SP100, WirelessHART™, ISM
• Data Interface: PCB, Surface Mount
• Memory Size: 256kB Flash, 4kB EEPROM, 8kB RAM
• Antenna Connector: PCB, Surface Mount
• Package / Case: 100-CBGA and 32-QFN
• Processor Series: ATMEGA256x
• Core: AVR8
• Data Bus Width: 8 bit
• Program Memory Type: Flash
• Program Memory Size: 256 KB
• Data Ram Size: 8 KB
• Development Tools By Supplier: ATAVRRZ541, ATAVRRAVEN, ATAVRRZRAVEN
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Voltage - Supply: -
• Power - Output: -
• Operating Temperature: -
• Applications: -
• Sensitivity: -
• Data Rate - Maximum: -
• Current - Transmitting: -
• Current - Receiving: -
• Lead Free Status / Rohs Status: Details

Figure 26-1. Block Diagram
26.3
2549M–AVR–09/10
TDI
TDO
TCK
TMS
TAP - Test Access Port
CONTROLLER
M
U
X
TAP
DEVICE BOUNDARY
INSTRUCTION
BREAKPOINT
SCAN CHAIN
REGISTER
REGISTER
REGISTER
BYPASS
ID
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
•
•
•
•
The IEEE std. 1149.1 also specifies an optional TAP signal; TRST – Test ReSeT – which is not
provided.
When the JTAGEN Fuse is unprogrammed, these four TAP pins are normal port pins, and the
TAP controller is in reset. When programmed, the input TAP signals are internally pulled high
and the JTAG is enabled for Boundary-scan and programming. The device is shipped with this
fuse programmed.
For the On-chip Debug system, in addition to the JTAG interface pins, the RESET pin is moni-
tored by the debugger to be able to detect external reset sources. The debugger can also pull
the RESET pin low to reset the whole system, assuming only open collectors on the reset line
are used in the application.
DECODER
ADDRESS
TMS: Test mode select. This pin is used for navigating through the TAP-controller state
machine.
TCK: Test Clock. JTAG operation is synchronous to TCK.
TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data
Register (Scan Chains).
TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
JTAG PROGRAMMING
MEMORY
FLASH
AND CONTROL
BREAKPOINT
OCD STATUS
INTERFACE
UNIT
Address
Data
I/O PORT 0
I/O PORT n
INTERNAL
FLOW CONTROL
CHAIN
SCAN
ATmega640/1280/1281/2560/2561
UNIT
BOUNDARY SCAN CHAIN
PC
Instruction
JTAG / AVR CORE
COMMUNICATION
PERIPHERAL
INTERFACE
AVR CPU
DIGITAL
UNITS
PERIPHERIAL
ANALOG
UNITS
Control & Clock lines
Analog inputs
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