PEB4265VV12NT Infineon Technologies, PEB4265VV12NT Datasheet - Page 108

• Manufacturer Part Number: PEB4265VV12NT
• Manufacturer: Infineon Technologies

Specifications of PEB4265VV12NT

• On-hook Transmission: Yes
• Polarity Reversal: Yes
• On-chip Ring Relay Driver: Yes
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Pin Count: 22
• Mounting: Surface Mount
• Lead Free Status / RoHS Status: Not Compliant

Preliminary
4.8.2
The two-channel chip set has a set of signal generators and features implemented to
accomplish a variety of diagnostic functions. The SLICOFI-2 device generates all test
signals, processes the information that comes back from the SLIC-E/-E2/-P and provides
the data to a higher level master device, e.g. a microprocessor. All the tests can be
initiated by the micropocessor and the results can be read back very easily. The
Integrated Test and Diagnosis Functions (ITDF) might prevent any problem which
affects service caused by the subscriber line or line equipment before the customer
complains. IDTF has been integrated to facilitate the monitoring of the subscriber loop.
4.8.2.1
The line test comprises the following functions:
• Loop resistance
• Leakage current Tip/Ring
• Leakage current Tip/GND
• Leakage current Ring/GND
• Ringer capacitance
• Line capacitance
• Line capacitance Tip/GND
• Line capacitance Ring/GND
• Foreign voltage measurement Tip/GND
• Foreign voltage measurement Ring/GND
• Foreign voltage measurement Tip/Ring
• Measurement of ringing voltage
• Measurement of line feed current
• Measurement of supply voltage V
• Measurement of transversal- and longitudinal current
Two main transfer paths (levelmeter) are implemented to accomplish all the different line
measurement functions (refer to
4.8.2.2
The signal sources available on the DuSLIC chip set are:
• Constant DC voltage (three programmable ringing DC offset voltages)
• 2 independent tone generators TG1 and TG2:
Data Sheet
Please refer to the CRAM coefficient set and register LMCR3 (bits RNG-
OFFSET[1:0]) on
Please refer to the CRAM coefficient set and register DSCR (bits PTG, TG2-EN, TG1-
EN) on
Page
Diagnostics
Line Test Capabilities
Integrated Signal Sources
200.
Page
206.
Figure
DD
of the SLICOFI-2
45).
108
Operational Description
2000-07-14
DuSLIC