SSTE32882KA1AKG IDT, Integrated Device Technology Inc, SSTE32882KA1AKG Datasheet - Page 66

• Manufacturer Part Number: SSTE32882KA1AKG
• Manufacturer: IDT, Integrated Device Technology Inc

Specifications of SSTE32882KA1AKG

• Lead Free Status / RoHS Status: Compliant

Test Circuits and Switching Waveforms
Parameter Measurement Information
1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY TEST AND QUAD CHIP SELECT
SSTE32882KA1
1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY TEST AND QUAD CHIP SELECT
All input pulses are supplied by generators having the following characteristics: 300MHz ≤ PRR ≤ 945 MHz; Zo = 50 Ω; input
slew rate = 1 V/ns ± 20%, unless otherwise specified. The outputs are measured one at a time with one transition per
measurement.
1 C
V
V
V
t
has to be taken when performing t
PDM
ICR
I
TT
(
P
L
-
= V
1, t
P
is parasitic (probe and jig capacitance).
Cross Point Voltage
) = 500mV (1.5V operation), 450mV (1.35V operation) or 400mv (1.25V operation).
PDM
DD
/2
2 the larger number of both has to be taken when performing t
CK Inputs
THE INFORMATION IN THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE
CK
CK
Q Output
R
Qn and Yn Load circuit for propagation delay and slew measurement
L
= 100Ω
Test point
Test point
T
L
= 50Ω
PDM
V
t
min measurement.
Voltage waveforms; propagation delay times
PDM
ICR
1
V
Trace delay matched on load board
TT
CK
CK
DUT
OUT
V
t
PDM
ICR
C
L
<2.5pF
2
V
PDM
(1)
TT
Test point
66
max measurement, the smaller number of both
V
I
(
P
-
P
)
R
L
=50Ω
COMMERCIAL TEMPERATURE RANGE
SSTE32882KA1
V
TT
7314/8