FR011L5J Fairchild Semiconductor, FR011L5J Datasheet - Page 3

• Manufacturer Part Number: FR011L5J
• Manufacturer: Fairchild Semiconductor

© 2012 Fairchild Semiconductor Corporation
FR011L5J • Rev. C
Absolute Maximum Ratings
Values are at T
Notes:
1.
2.
Thermal Characteristics
I
I
DIODE_PULSE
V+
DIODE_CONT
Symbol
V-
Symbol
V+
ESD
R
R
MAX_OP
The V
qualification devices, where the predicted failure rate is less than 0.01% at the specified voltage for 24 hours. It is
intended to indicate the device’s ability to withstand transient events that exceed the recommended operating
voltage rating. Specification is based on qualification devices tested using accelerated destructive testing at
higher voltages, as well as production pulse testing at the V
Results are also subject to variation based on implementation, environmental considerations, and circuit
dynamics. Systems should never be designed with the intent to normally operate at V
Semiconductor for additional information.
The device power dissipation and thermal resistance (R
FR4 printed circuit boards, as shown in Figure 4 and Figure 5
MAX_OP
P
T
θJA
θJA
D
Figure 4. 1 Square Inch of 2-ounce copper
J
24
+24
Steady-State Normal Operating Voltage between CTL and NEG Pins
(V
24-Hour Normal Operating Voltage Withstand Capability between CTL and
NEG Pins (V
Steady-State Reverse Bias Standoff Voltage between CTL and NEG Pins
(V
Operating Junction Temperature
Power Dissipation
Steady-State Diode Continuous Forward Current from POS to NEG
Pulsed Diode Forward Current from POS to NEG (300µs Pulse)
Electrostatic Discharge
Capability
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
rating is NOT a survival guarantee. It is a statistically calculated survivability reference point taken on
A
IN
IN
=25°C unless otherwise noted.
= V+
= V-
MAX_OP
MAX_OP
IN
= V+
)
, I
IN
= 1.5A, Switch On)
24
, I
IN
= 1.5A, Switch On)
T
T
Human Body Model, JESD22-A114
Charged Device Model, JESD22-C101
A
A
Parameter
Parameter
= 25°C
= 25°C
(2)
(2)
(2)
(2)
(see Figure 4)
(see Figure 5)
(see Figure 4)
(see Figure 5)
3
θ
) are characterized with device mounted on the following
+24
Figure 5. Minimum Pads of 2-ounce Copper
level. Production device field life results may vary.
+24
levels. Contact Fairchild
Values
Value
2000
+20
+29
150
600
153
210
2.4
0.9
-30
61
2
www.fairchildsemi.com
°C/W
Unit
Unit
°C
W
V
A
V