f25l016a Elite Semiconductor Memory Technology Inc., f25l016a Datasheet - Page 25

• Manufacturer Part Number: f25l016a
• Description: 3v Only Serial Flash Memory
• Manufacturer: Elite Semiconductor Memory Technology Inc.

ESMT
TABLE 9: RELIABILITY CHARACTERISTICS
1.
TABLE 10 : AC OPERATING CHARACTERISTICS T
1. Relative to SCK.
Elite Semiconductor Memory Technology Inc.
F
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
N
T
I
LTH
CLK
SCKH
SCKL
LZ
OH
V
DR
CES
CEH
CHS
CHH
CPH
CHZ
CLZ
DS
DH
HLS
HHS
HLH
HHH
HZ
END
This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Symbol
Symbol
1
1
1
1
1
1
1
Endurance
Data Retention
Latch Up
Serial Clock Frequency
Serial Clock High Time
Serial Clock Low Time
SCK Low to Low-Z Output
Data In Setup Time
Data In Hold Time
Output Hold from SCK Change
Output Valid from SCK
HOLD Low Setup Time
HOLD High Setup Time
HOLD Low Hold Time
HOLD High Hold Time
HOLD Low to High-Z Output
HOLD High to Low-Z Output
CE Active Setup Time
CE Active Hold Time
CE Not Active Setup Time
CE Not Active Hold Time
CE High Time
CE High to High-Z Output
Parameter
Parameter
Normal 33MHz Fast 50 MHz
VDD=2.7~3.6V VDD=2.7~3.6V VDD=2.7~3.6V VDD=3.0~3.6V
Min
100
13
13
5
5
5
5
0
3
3
5
5
5
5
0
Minimum Specification
Max
33
12
9
9
9
A=
100 + IDD
0~70
100,000
Min
100
10
9
9
5
5
5
5
0
3
3
5
5
5
5
0
o
C
Max
50
9
9
9
8
Fast 75 MHz Fast 100 MHz
Min
100
6
0
3
6
5
5
5
5
3
5
5
5
5
0
Publication Date: Jul. 2008
Revision:
Cycles
Years
Units
mA
Max
7.5
75
9
9
9
Min
100
5
5
5
5
5
5
0
3
3
5
5
5
5
0
F25L016A
1.4
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
Max
100
Test Method
9
9
9
7
25/32
Units
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns