M58BW032BB45T3T STMICROELECTRONICS [STMicroelectronics], M58BW032BB45T3T Datasheet - Page 31
M58BW032BB45T3T
Manufacturer Part Number
M58BW032BB45T3T
Description
32 Mbit (1Mb x32, Boot Block, Burst) 3.3V Supply Flash Memory
Manufacturer
STMICROELECTRONICS [STMicroelectronics]
Datasheet
1.M58BW032BB45T3T.pdf
(60 pages)
- Current page: 31 of 60
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DC AND AC PARAMETERS
This section summarizes the operating and mea-
surement conditions, and the DC and AC charac-
teristics of the device. The parameters in the DC
and AC characteristics Tables that follow, are de-
rived from tests performed under the Measure-
Table 13. Operating and AC Measurement Conditions
Figure 6. AC Measurement Input Output
Waveform
Note: V
Table 14. Device Capacitance
Note: 1. T
Supply Voltage (V
Input/Output Supply Voltage (V
Ambient Temperature (T
Load Capacitance (C
Clock Rise and Fall Times
Input Rise and Fall Times
Input Pulses Voltages
Input and Output Timing Ref. Voltages
V DDQIN
V DDQ
Symbol
C
2. Sampled only, not 100% tested.
C
OUT
0V
DD
IN
A
= V
= 25°C, f = 1 MHz
DDQ
.
Input Capacitance
Output Capacitance
DD
)
L
)
Parameter
A
)
DDQ
Parameter
)
M58BW032BT, M58BW032BB, M58BW032DT, M58BW032DB
V DDQIN /2
V DDQ /2
AI04153
Test Condition
V
V
OUT
IN
= 0V
= 0V
ment
13., Operating and AC Measurement
Designers should check that the operating condi-
tions in their circuit match the measurement condi-
tions when relying on the quoted parameters.
Figure 7. AC Measurement Load Circuit
Grade 6
Grade 3
C L includes JIG capacitance
DEVICE
UNDER
TEST
Conditions
Typ
6
8
Min
–40
–40
3.0
2.4
0 to V
V
Value
DDQ
summarized
30
DDQ
/2
Max
C L
12
Max
8
125
3.6
3.6
90
3
3
OUT
Conditions.
in
Units
Unit
AI04154b
pF
pF
°C
°C
pF
ns
ns
V
V
V
V
Table
31/60
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