CA3130EZ Intersil, CA3130EZ Datasheet - Page 6

• Manufacturer Part Number: CA3130EZ
• Description: IC OP AMP 15MHZ BIMOS 8-DIP
• Manufacturer: Intersil

Specifications of CA3130EZ

• Amplifier Type: General Purpose
• Number Of Circuits: 1
• Slew Rate: 30 V/µs
• Gain Bandwidth Product: 15MHz
• Current - Input Bias: 5pA
• Voltage - Input Offset: 8000µV
• Current - Supply: 10mA
• Current - Output / Channel: 45mA
• Voltage - Supply, Single/dual (±): 5 V ~ 16 V, ±2.5 V ~ 8 V
• Operating Temperature: -55°C ~ 125°C
• Mounting Type: Through Hole
• Package / Case: 8-DIP (0.300", 7.62mm)
• Bandwidth: 15 MHz
• Common Mode Rejection Ratio: 90
• Current, Input Bias: 0.000005 μA
• Current, Input Offset: 0.5 pA
• Current, Output: 22 mA
• Current, Supply: 10 mA
• Number Of Amplifiers: Single
• Package Type: PDIP-8
• Resistance, Input: 1.5 Teraohms
• Temperature, Operating, Range: -55 to +125 °C
• Time, Rise: 0.09 μs
• Voltage, Gain: 320 kV/V
• Voltage, Input: -0.5 to 23 V
• Voltage, Noise: 23000 nV/sqrt Hz
• Voltage, Offset: 8 mV
• Voltage, Output, High: 13.3 V
• Voltage, Output, Low: 0.002 V
• Voltage, Supply: 5 to 16 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Output Type: -
• -3db Bandwidth: -
• Lead Free Status / Rohs Status: RoHS Compliant part Electrostatic Device

Input Current Variation with Common Mode Input
Voltage
As shown in the Table of Electrical Specifications, the input
current for the CA3130 Series Op Amps is typically 5pA at
TA = 25oC when Terminals 2 and 3 are at a common-mode
potential of +7.5V with respect to negative supply Terminal 4.
Figure 3 contains data showing the variation of input current
as a function of common-mode input voltage at TA = 25oC.
These data show that circuit designers can advantageously
exploit these characteristics to design circuits which typically
require an input current of less than 1pA, provided the
common-mode input voltage does not exceed 2V. As
previously noted, the input current is essentially the result of
the leakage current through the gate-protection diodes in the
input circuit and, therefore, a function of the applied voltage.
Although the finite resistance of the glass terminal-to-case
insulator of the metal can package also contributes an
increment of leakage current, there are useful compensating
factors. Because the gate-protection network functions as if
it is connected to Terminal 4 potential, and the Metal Can
case of the CA3130 is also internally tied to Terminal 4, input
Terminal 3 is essentially “guarded” from spurious leakage
currents.
Offset Nulling
Offset-voltage nulling is usually accomplished with a
100,000Ω potentiometer connected across Terminals 1 and
5 and with the potentiometer slider arm connected to
Terminal 4. A fine offset-null adjustment usually can be
effected with the slider arm positioned in the mid-point of the
potentiometer’s total range.
Input-Current Variation with Temperature
The input current of the CA3130 Series circuits is typically
5pA at 25oC. The major portion of this input current is due to
leakage current through the gate-protective diodes in the
input circuit. As with any semiconductor-junction device,
including op amps with a junction-FET input stage, the
leakage current approximately doubles for every 10oC
increase in temperature. Figure 4 provides data on the
FIGURE 3. INPUT CURRENT vs COMMON-MODE VOLTAGE
7.5
2.5
10
5
0
-1
T
A
0
= 25
o
C
1
2
INPUT CURRENT (pA)
3
6
4
PA
V
IN
5
2
3
6
CA3130
4
7
V+
V-
7
8
CA3130, CA3130A
-10V
15V
TO
0V
TO
5V
6
typical variation of input bias current as a function of
temperature in the CA3130.
In applications requiring the lowest practical input current
and incremental increases in current because of “warm-up”
effects, it is suggested that an appropriate heat sink be used
with the CA3130. In addition, when “sinking” or “sourcing”
significant output current the chip temperature increases,
causing an increase in the input current. In such cases, heat-
sinking can also very markedly reduce and stabilize input
current variations.
Input Offset Voltage (V
and Device Operating Life
It is well known that the characteristics of a MOSFET device
can change slightly when a DC gate-source bias potential is
applied to the device for extended time periods. The
magnitude of the change is increased at high temperatures.
Users of the CA3130 should be alert to the possible impacts
of this effect if the application of the device involves extended
operation at high temperatures with a significant differential
DC bias voltage applied across Terminals 2 and 3. Figure 5
shows typical data pertinent to shifts in offset voltage
encountered with CA3130 devices (metal can package)
during life testing. At lower temperatures (metal can and
plastic), for example at 85oC, this change in voltage is
considerably less. In typical linear applications where the
differential voltage is small and symmetrical, these
incremental changes are of about the same magnitude as
those encountered in an operational amplifier employing a
bipolar transistor input stage. The 2VDC differential voltage
example represents conditions when the amplifier output
stage is “toggled”, e.g., as in comparator applications.
4000
1000
100
10
1
FIGURE 4. INPUT CURRENT vs TEMPERATURE
-80 -60 -40
V
S
= ±7.5V
-20
TEMPERATURE (
IO
0
) Variation with DC Bias
20
40
o
60
C)
80
100 120 140