HCPL2631W Fairchild Semiconductor, HCPL2631W Datasheet - Page 4

• Manufacturer Part Number: HCPL2631W
• Description: High Speed Optocouplers 2Ch 10MBit/s Optocpl Logic Gate Output
• Manufacturer: Fairchild Semiconductor

Specifications of HCPL2631W

• Isolation Voltage: 2500 Vrms
• Maximum Continuous Output Current: 50 mA
• Maximum Fall Time: 12 ns
• Maximum Forward Diode Current: 30 mA
• Maximum Rise Time: 50 ns
• Output Device: Logic Gate Photo IC
• Configuration: 2 Channel
• Maximum Baud Rate: 10 MBps
• Maximum Forward Diode Voltage: 1.75 V
• Maximum Reverse Diode Voltage: 5 V
• Maximum Power Dissipation: 60 mW
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Package / Case: PDIP-8
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

©2005 Fairchild Semiconductor Corporation
6N137, HCPL2601, HCPL2611, HCPL2630, HCPL2631 Rev. 1.0.8
Electrical Characteristics
Transfer Characteristics
Isolation Characteristics
*All Typicals at V
Notes:
1. The V
2. Each channel.
3. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
4. t
5. t
6. t
7. t
8. t
9. t
10. CM
11. CM
12. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted
Symbol
Symbol
V
R
C
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible
to the package V
pulse to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse.
pulse to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse.
voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
HIGH state (i.e., V
LOW output state (i.e., V
together.
V
I
PLH
PHL
r
f
ELH
EHL
I
I
I-O
ISO
OH
– Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
– Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
FT
I-O
I-O
OL
L
H
– Propagation delay is measured from the 3.75mA level on the HIGH to LOW transition of the input current
– Propagation delay is measured from the 3.75mA level on the LOW to HIGH transition of the input current
– Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input
– Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input
– The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the
– The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the
CC
Input-Output Insulation
Leakage Current
Withstand Insulation Test
Voltage
Resistance (Input to Output)
Capacitance (Input to Output)
supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
HIGH Level Output Current
LOW Level Output Current
Input Threshold Current
CC
DC Characteristics
Characteristics
= 5V, T
CC
OUT
and GND pins of each device.
> 2.0V). Measured in volts per microsecond (V/µs).
A
= 25°C
OUT
(T
(T
A
A
< 0.8V). Measured in volts per microsecond (V/µs).
= -40 to +85°C unless otherwise specified)
= -40°C to +85°C unless otherwise specified.)
(Continued)
V
I
V
I
V
I
F
CL
OL
Relative humidity = 45%,
T
V
RH < 50%, T
I
V
f = 1MHz
I-O
CC
CC
CC
A
I-O
I-O
= 250µA, V
= 13mA
= 25°C, t = 5s,
= 13mA
Test Conditions
≤ 2µA, t = 1 min.
= 5.5V, V
= 5.5V, I
= 5.5V, V
= 3000 VDC
= 500V
Test Conditions
(12)
(2)
(12)
F
A
E
O
O
4
= 5mA, V
= 25°C,
= 2.0V
= 5.5V,
= 0.6V, V
(12)
(12)
(2)
E
E
= 2.0V,
= 2.0V,
Min.
2500
Min.
Typ.*
10
0.6
12
Typ.*
.35
3
Max.
1.0*
Max.
100
0.6
5
www.fairchildsemi.com
V
Unit
Unit
µA
pF
RMS
mA
Ω
µA
V