GRM155R60J225ME15D Murata, GRM155R60J225ME15D Datasheet - Page 136

• Manufacturer Part Number: GRM155R60J225ME15D
• Manufacturer: Murata

Specifications of GRM155R60J225ME15D

• Tolerance (+ Or -): 20%
• Voltage: 6.3VDC
• Temp Coeff (dielectric): X5R
• Operating Temp Range: -55C to 85C
• Mounting Style: Surface Mount
• Construction: SMT Chip
• Case Style: Ceramic Chip
• Failure Rate: Not Required
• Wire Form: Not Required
• Product Length (mm): 1mm
• Product Depth (mm): 0.5mm
• Product Height (mm): 0.5mm
• Product Diameter (mm): Not Requiredmm
• Capacitance: 2.2uF
• Package / Case: 0402
• Lead Free Status / RoHS Status: Compliant

8
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
134
No.
10
11
12
Mounting for testing : The capacitors should be mounted on the substrate as shown below using die bonding. when tests No.11 to 14 are performed.
GMD Series Specifications and Test Methods (2)
GMD Series Specifications and Test Methods (2)
1
2
3
4
5
6
7
8
9
Operating
Temperature
Range
Rated Voltage
Appearance
Dimensions
Dielectric Strength
Insulation
Resistance
Capacitance
Dissipation
Factor (D.F.)
Capacitance
Temperature
Characteristics
Mechanical
Strength
Vibration
Resistance
Temperature
Sudden
Change
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
No bias
Bond
Strength
Die Shear
Strength
Appearance No defects or abnormalities.
Capacitance Within the specified tolerance.
D.F.
Appearance No defects or abnormalities.
Capacitance
Change
D.F.
I.R.
Dielectric
Strength
R6 : –55 C to 85 C
See the previous pages.
No defects or abnormalities.
Within the specified dimensions.
No defects or abnormalities.
More than 50 · F
Within the specified tolerance.
R6 : 0.1 max.
R6 : Within 15% (–55 C to +85 C)
Pull force : 0.03N min.
Die Shear force : 2N min.
R6 : 0.1 max.
R6 : Within 7.5%
R6 : 0.1 max.
More than 50 · F
No defects
In case Non "*" is added in PNs table, please refer to GMD Series Specifications and Test Methods (1).
Specifications
In case "*" is added in PNs table, please refer to GMD Series Specifications and Test Methods (2).
Reference Temperature : 25 C
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
whichever is larger, should be maintained within the rated volt-
age range.
Visual inspection.
Using calipers.
No failure should be observed when 250% of the rated voltage
is applied between the terminations for 1 to 5 seconds, provid-
ed the charge/discharge current is less than 50mA.
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at normal temperature
and humidity and within 1 minutes of charging.
The capacitance/D.F. should be measured at reference
temperature at the frequency and voltage shown in the table.
*1 GMD155 R6 1A 124 to 224 are applied to 0.5 0.1 Vrms.
The capacitance change should be measured after 5min. at
each specified temp. stage.
The ranges of capacitance change compared with the
Reference Temperature value over the temperature ranges
shown in the table should be within the specified ranges.*
*Initial measurement for high dielectric constant type
Perform a heat treatment at 150 +0/–10 C for one hour and
then let sit for 24 2 hours at room temperature.
Perform the initial measurement.
MIL-STD-883 Method 2011 Condition D
Mount the capacitor on a gold metallized alumina substrate with
Au-Sn (80/20) and bond a 25 m (0.001 inch) gold wire to the
capacitor terminal using an ultrasonic ball bond. Then, pull wire.
MIL-STD-883 Method 2019
Mount the capacitor on a gold metallized alumina substrate
with Au-Sn (80/20). Apply the force parallel to the substrate.
Ramp frequency from 10 to 55Hz then return to 10Hz all within
1 minute. Amplitude : 1.5 mm (0.06 inch) max. total excursion.
Apply this motion for a period of 2 hours in each of 3 mutually
perpendicular directions (total 6 hours).
The capacitor should be set for 24 2 hours at room
temperature after one hour heat of treatment at 150+0/–10 C,
then measure for the initial measurement. Fix the capacitor to
the supporting jig in the same manner and under the same
conditions as (11) and conduct the five cycles according to the
temperatures and time shown in the following table. Set it for
24 2 hours at room temperature, then measure.
Temp. ( C)
Time (min.)
CV10 F (10Vmin.)*
CV10 F (6.3Vmax.)
Step
Step
1
2
3
4
Capacitance
Temp.+0/–3
Operating
30 3
Min.
1
1
Test Method
Frequency
1 0.1kHz
1 0.1kHz
Temperature ( C)
Temp.
Room
2 to 3
Continued on the following page.
2
–55 3
25 2
25 2
85 3
Temp. +3/–0
Operating
1.0 0.2Vrms
0.5 0.1Vrms
Max.
30 3
Voltage
3
P-P
Temp.
Room
2 to 3
or V
4
O-P
,
C02E.pdf
09.9.18