FDY100PZ Fairchild Semiconductor, FDY100PZ Datasheet
FDY100PZ
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FDY100PZ Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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Change To Results/Discussion for Qual Plan NumberQ20080344 Test: (Autoclave) Lot Device Q20080344AAACLV FDY2000PZ Q20080344BAACLV FDY300NZ Q20080344CAACLV FDY4000CZ Test: (High Temperature Gate Bias) Lot Device Q20080344AAHTGB FDY2000PZ 96-HOURS 0/79 0/79 0/79 168-HOURS 500-HOURS 1000-HOURS 0/79 0/79 Failure Code Failure Code Pg. ...
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... Device Q20080344AATMCL1 FDY2000PZ Q20080344AATMCL1 FDY2000PZ Q20080344BATMCL1 FDY300NZ Q20080344BATMCL1 FDY300NZ Q20080344CATMCL1 FDY4000CZ Q20080344CATMCL1 FDY4000CZ Product Id Description : All devices packaged with SOT-523F and SOT-563F. Affected FSIDs : 2N7002T FDY100PZ FDY2001PZ FDY300NZ FDY4000CZ FJY3002R FJY3005R FJY3008R FJY3011R FJY3014R FJY4002R FJY4005R FJY4008R FJY4011R FJY4014R MMBT3904T 0/79 ...