FQN1N50CTA Fairchild Semiconductor, FQN1N50CTA Datasheet

MOSFET N-CH 500V 380MA TO-92

FQN1N50CTA

Manufacturer Part Number
FQN1N50CTA
Description
MOSFET N-CH 500V 380MA TO-92
Manufacturer
Fairchild Semiconductor
Series
QFET™r
Datasheet

Specifications of FQN1N50CTA

Fet Type
MOSFET N-Channel, Metal Oxide
Fet Feature
Standard
Rds On (max) @ Id, Vgs
6 Ohm @ 190mA, 10V
Drain To Source Voltage (vdss)
500V
Current - Continuous Drain (id) @ 25° C
380mA
Vgs(th) (max) @ Id
4V @ 250µA
Gate Charge (qg) @ Vgs
6.4nC @ 10V
Input Capacitance (ciss) @ Vds
195pF @ 25V
Power - Max
890mW
Mounting Type
Through Hole
Package / Case
TO-92-3 (Standard Body), TO-226
Configuration
Single
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
6 Ohm @ 10 V
Forward Transconductance Gfs (max / Min)
0.6 S
Drain-source Breakdown Voltage
500 V
Gate-source Breakdown Voltage
+/- 30 V
Continuous Drain Current
0.38 A
Power Dissipation
890 mW
Maximum Operating Temperature
+ 150 C
Mounting Style
Through Hole
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FQN1N50CTA

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FQN1N50CTA
Manufacturer:
Fairchild Semiconductor
Quantity:
25 814
Part Number:
FQN1N50CTA
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
©2006 Fairchild Semiconductor Corporation
FQN1N50C Rev. A
FQN1N50C
500V N-Channel MOSFET
Features
• 0.38 A, 500 V, R
• Low gate charge ( typical 4.9 nC )
• Low Crss ( typical 4.1 pF)
• Fast switching
• 100 % avalanche tested
• Improved dv/dt capability
Absolute Maximum Ratings
Thermal Characteristics
V
I
I
V
E
I
E
dv/dt
P
T
T
R
R
D
DM
AR
Symbol
Symbol
J
L
DSS
GSS
AS
AR
D
θJL
θJA
, T
STG
Drain-Source Voltage
Drain Current
Drain Current
Gate-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (T
Power Dissipation (T
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
Thermal Resistance, Junction-to-Lead
Thermal Resistance, Junction-to-Ambient
DS(on)
= 6.0 Ω @ V
G
D
S
- Continuous (T
- Continuous (T
- Pulsed
- Derate above 25°C
A
L
Parameter
Parameter
= 25°C)
= 25°C)
GS
= 10 V
C
C
TO-92
FQN Series
= 25°C)
= 100°C)
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
(Note 6a)
(Note 6b)
1
Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficiency switched mode power supplies, active power factor
correction, electronic lamp ballasts based on half bridge
topology.
G
Typ
--
--
FQN1N50C
-55 to +150
0.017
S
0.38
0.24
3.04
± 30
44.4
0.38
0.21
0.89
2.08
500
300
4.5
D
Max
140
60
QFET
January 2006
www.fairchildsemi.com
Units
Units
W/°C
°C/W
°C/W
V/ns
mJ
mJ
°C
°C
W
W
V
A
A
A
V
A
®

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FQN1N50CTA Summary of contents

Page 1

... Symbol Parameter R Thermal Resistance, Junction-to-Lead θJL R Thermal Resistance, Junction-to-Ambient θJA ©2006 Fairchild Semiconductor Corporation FQN1N50C Rev. A Description = 10 V These N-Channel enhancement mode power field effect GS transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to ...

Page 2

Package Marking and Ordering Information Device Marking Device 1N50C FQN1N50C Electrical Characteristics Symbol Parameter Off Characteristics BV Drain-Source Breakdown Voltage DSS ∆BV / Breakdown Voltage Temperature DSS ∆T Coefficient J I Zero Gate Voltage Drain Current DSS I Gate-Body Leakage ...

Page 3

Typical Performance Characteristics Figure 1. On-Region Characteristics V GS Top : 15.0 V 10 6.5 V 6.0 V 5.5 V 5.0 V Bottom : 4 ...

Page 4

Typical Performance Characteristics Figure 7. Breakdown Voltage Variation vs. Temperature 1.2 1.1 1.0 0.9 0.8 -100 - Junction Temperature [ J Figure 9. Maximum Safe Operating Area Operation in This Area -1 ...

Page 5

Unclamped Inductive Switching Test Circuit & Waveforms FQN1N50C Rev. A Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms 5 www.fairchildsemi.com ...

Page 6

Peak Diode Recovery dv/dt Test Circuit & Waveforms FQN1N50C Rev www.fairchildsemi.com ...

Page 7

Mechanical Dimensions ±0.10 0.46 1.27TYP ±0.20 [1.27 FQN1N50C Rev. A TO-92 +0.25 4.58 –0.15 1.27TYP ±0.20 ] [1.27 ] 3.60 ±0.20 (R2.29) 7 +0.10 0.38 –0.05 Dimensions in Millimeters www.fairchildsemi.com ...

Page 8

... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. FAST ® ACEx™ ActiveArray™ FASTr™ Bottomless™ FPS™ Build it Now™ FRFET™ CoolFET™ ...

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