BC33725BU Fairchild Semiconductor, BC33725BU Datasheet - Page 3

• Manufacturer Part Number: BC33725BU
• Description: TRANSISTOR NPN 45V 800MA TO-92
• Manufacturer: Fairchild Semiconductor

Specifications of BC33725BU

• Transistor Type: NPN
• Current - Collector (ic) (max): 800mA
• Voltage - Collector Emitter Breakdown (max): 45V
• Vce Saturation (max) @ Ib, Ic: 700mV @ 50mA, 500mA
• Current - Collector Cutoff (max): 100nA
• Dc Current Gain (hfe) (min) @ Ic, Vce: 160 @ 100mA, 1V
• Power - Max: 625mW
• Frequency - Transition: 100MHz
• Mounting Type: Through Hole
• Package / Case: TO-92-3 (Standard Body), TO-226
• Configuration: Single
• Transistor Polarity: NPN
• Mounting Style: Through Hole
• Collector- Emitter Voltage Vceo Max: 45 V
• Emitter- Base Voltage Vebo: 5 V
• Continuous Collector Current: 0.8 A
• Maximum Dc Collector Current: 0.8 A
• Power Dissipation: 625 mW
• Maximum Operating Frequency: 100 MHz
• Maximum Operating Temperature: + 150 C
• Dc Collector/base Gain Hfe Min: 100
• Number Of Elements: 1
• Collector-emitter Voltage: 45V
• Emitter-base Voltage: 5V
• Collector Current (dc) (max): 800mA
• Dc Current Gain (min): 160
• Frequency (max): 100MHz
• Operating Temp Range: -55C to 150C
• Operating Temperature Classification: Military
• Mounting: Through Hole
• Pin Count: 3
• Package Type: TO-92
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Lot
Q20070371AAPRCL
Q20070371ABPRCL
Q20070371BAPRCL
Test: (Temperature Humidity Biased Test)
Lot
Q20070371AATHBT
Q20070371ABTHBT
Q20070371BATHBT
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070371AATMCL1
Q20070371AATMCL1
Q20070371ABTMCL1
Q20070371ABTMCL1
Q20070371BATMCL1
Q20070371BATMCL1
Test: Ambient Storage for Whisker Growth (Storage Bake)
Lot
Q20070371AASBAKE
Q20070371ABSBAKE
Q20070371BASBAKE
Test: TMCL for Whisker Growth (Temperature Cycle)
Lot
Q20070371AATMCL4
Q20070371ABTMCL4
Q20070371BATMCL4
Test: Temp/Humidity Storage for Whisker Growth (Aging Bake)
Lot
Q20070371AAABAKE
Q20070371ABABAKE
Q20070371BAABAKE
Product Id Description :
Affected FSIDs :
2N3904BU
2N3904CTA
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSB564ACGBU
KSB564ACGBU
KSB564ACGBU
KSP44BU_NL
KSP44BU_NL
Device
KSB564ACGBU
KSB564ACGBU
KSP44BU_NL
2N3904BU_NL
2N3904NLBU
168-HOURS
0/77
0/77
0/129
2000-HOURS
0/3
0/3
0/3
500-CYCLES
0/3
0/3
0/3
2000-HOURS
0/3
0/3
0/3
200-CYCLES
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/129
3000-HOURS
0/3
0/3
0/3
1000-CYCLES
0/3
0/3
0/3
3000-HOURS
0/3
0/3
0/3
500-CYCLES
0/77
0/77
0/77
1000-HOURS
0/77
0/77
1/129
4000-HOURS
0/3
0/3
0/3
1500
0/3
0/3
0/3
4000-HOURS
0/3
0/3
0/3
2N3904CBU
2N3904TA
Failure Code
Failure Code
Bake Recoverable
(Moisture Induced
Leakage)
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 3