STM32F100RET6B STMicroelectronics, STM32F100RET6B Datasheet - Page 21

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STM32F100RET6B

Manufacturer Part Number
STM32F100RET6B
Description
16/32-BITS MICROS
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F100RET6B

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
24MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
DMA, PDR, POR, PVD, PWM, Temp Sensor, WDT
Number Of I /o
51
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Eeprom Size
-
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b; D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-LQFP
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

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STM32F100xC, STM32F100xD, STM32F100xE
2.2.25
2.2.26
2.2.27
DAC (digital-to-analog converter)
The two 12-bit buffered DAC channels can be used to convert two digital signals into two
analog voltage signal outputs. The chosen design structure is composed of integrated
resistor strings and an amplifier in noninverting configuration.
This dual digital Interface supports the following features:
Eight DAC trigger inputs are used in the STM32F100xx. The DAC channels are triggered
through the timer update outputs that are also connected to different DMA channels.
Temperature sensor
The temperature sensor has to generate a voltage that varies linearly with temperature. The
conversion range is between 2 V < V
connected to the ADC1_IN16 input channel which is used to convert the sensor output
voltage into a digital value.
Serial wire JTAG debug port (SWJ-DP)
The ARM SWJ-DP Interface is embedded, and is a combined JTAG and serial wire debug
port that enables either a serial wire debug or a JTAG probe to be connected to the target.
The JTAG TMS and TCK pins are shared respectively with SWDIO and SWCLK and a
specific sequence on the TMS pin is used to switch between JTAG-DP and SW-DP.
two DAC converters: one for each output channel
up to 10-bit output
left or right data alignment in 12-bit mode
synchronized update capability
noise-wave generation
triangular-wave generation
dual DAC channels’ independent or simultaneous conversions
DMA capability for each channel
external triggers for conversion
input voltage reference V
REF+
Doc ID 15081 Rev 5
DDA
< 3.6 V. The temperature sensor is internally
Description
21/97

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