SAA7154E/V2/G,518 NXP Semiconductors, SAA7154E/V2/G,518 Datasheet - Page 14

• Manufacturer Part Number: SAA7154E/V2/G,518
• Manufacturer: NXP Semiconductors

Specifications of SAA7154E/V2/G,518

• Adc/dac Resolution: 10b
• Screening Level: Commercial
• Package Type: LBGA
• Pin Count: 156
• Lead Free Status / RoHS Status: Compliant

NXP Semiconductors
SAA7154E_SAA7154H_2
Product data sheet
Table 4.
[1]
[2]
[3]
[4]
[5]
[6]
[7]
Symbol
TDO
TMS
TRST_N
Pins not in use
i.c.
i.c.
i.c.
i.c.
i.c.
i.c.
i.c.
i.c.
i.c.
i.c.
i.c.
i.c.
n.c.
n.c.
n.c.
n.c.
n.c.
n.c.
n.c.
A = analog, I = input, O = output, P = power, st = strapping, pu = pull-up, pd = pull-down, od = open-drain.
Pin strapping is done by connecting the pin to the supply through a 4.7 k resistor. During the power-up
reset sequence the corresponding pins are switched to input mode to read the strapping level. For the
default setting, no strapping resistor is necessary (internal pull-down).
Pin ALRCLK operates as crystal selector during power-up; ALRCLK strapped to logic 0 for a 24.576 MHz
crystal (default); ALRCLK strapped to logic 1 for a 32.110 MHz crystal.
Pin RTCO operates as I
addresses 42h/43h and 4Ah/4Bh (default); RTCO strapped to logic 1 for slave address 40h/41h and
48h/49h.
In accordance with the IEEE1149.1 standard the pads TDI, TMS, TCK and TRST_N are input pads with an
internal pull-up transistor and TDO is a 3-state output pad.
For board design without boundary scan implementation connect the TRST_N pin to ground.
This pin provides easy initialization of the Boundary Scan Test (BST) circuit. TRST_N can be used to force
the Test Access Port (TAP) controller to the TEST_LOGIC_RESET state (normal operation) at once.
Pin description
Pin
QFP160 LBGA156
150
149
147
1
42
52
53
54
55
56
57
58
60
61
62
80
81
82
121
122
159
160
A5
D6
C6
B2
N3
N6
P6
M6
L6
N7
P7
L7
M7
P8
N8
N14
-
-
-
-
C3
C4
Rev. 02 — 6 December 2007
2
C-bus slave address selector during power-up; RTCO strapped to logic 0 for slave
…continued
Type
O
I/pu
I/pu
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
[1]
Description
test data output for boundary scan test
test mode select input for boundary scan test or scan
test
test reset input (active LOW), for boundary scan test
(with internal pull-up)
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
internally connected; leave open
not connected
not connected
not connected
not connected
not connected
not connected
not connected
SAA7154E; SAA7154H
Multistandard video decoder with comb filter
[5]
[5][6][7]
© NXP B.V. 2007. All rights reserved.
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