MOC217R2M Fairchild Semiconductor, MOC217R2M Datasheet - Page 3

Transistor Output Optocouplers 8-Pin Optocoupler Phototransistor

MOC217R2M

Manufacturer Part Number
MOC217R2M
Description
Transistor Output Optocouplers 8-Pin Optocoupler Phototransistor
Manufacturer
Fairchild Semiconductor
Datasheet

Specifications of MOC217R2M

Input Type
DC
Output Type
DC
Output Device
Transistor With Base
Number Of Elements
1
Reverse Breakdown Voltage
6V
Forward Voltage
1.3V
Forward Current
60mA
Collector-emitter Voltage
30V
Package Type
SOIC W
Collector Current (dc) (max)
150mA
Isolation Voltage
2500Vrms
Power Dissipation
250mW
Collector-emitter Saturation Voltage
0.4V
Pin Count
8
Mounting
Surface Mount
Operating Temp Range
-40C to 100C
Operating Temperature Classification
Industrial
Configuration
1 Channel
Maximum Collector Emitter Voltage
30 V
Maximum Collector Emitter Saturation Voltage
0.4 V
Maximum Forward Diode Voltage
1.3 V
Maximum Collector Current
150 mA
Maximum Power Dissipation
250 mW
Maximum Operating Temperature
+ 100 C
Minimum Operating Temperature
- 40 C
Package / Case
SOIC-8 Narrow
Maximum Input Diode Current
60 mA
Maximum Reverse Diode Voltage
6 V
Lead Free Status / Rohs Status
Compliant

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©2005 Fairchild Semiconductor Corporation
MOC215M, MOC216M, MOC217M Rev. 1.0.1
Electrical Characteristics
*Typical values at T
Notes:
1. Isolation Surge Voltage, V
2. For this test, Pins 1 and 2 are common and Pins 5, 6 and 7 are common.
3. V
4. Current Transfer Ratio (CTR) = I
EMITTER
DETECTOR
COUPLED
Symbol
V
BV
BV
I
CTR
CE(sat)
V
R
C
C
CEO
t
t
ISO
V
I
C
ISO
ISO
ISO
on
off
t
t
CEO
ECO
CE
R
r
f
F
rating of 2500 V
Forward Voltage
Reverse Leakage Current
Capacitance
Collector-Emitter Dark Current
Collector-Emitter Breakdown Voltage
Emitter-Collector Breakdown Voltage
Collector-Emitter Capacitance
Output Collector Current
Collector-Emitter Saturation Voltage
Turn-On Time
Turn-Off Time
Rise Time
Fall Time
Input-Output Isolation Voltage
Isolation Resistance
Isolation Capacitance
MOC215M
MOC216M
MOC217M
A
= 25°C
Characteristic
AC(rms)
ISO
(2)
for t = 1 min. is equivalent to a rating of 3,000 V
(2)
, is an internal device dielectric breakdown rating.
(4)
C
/I
(T
F
A
x 100%.
(1)(2)(3)
= 25°C unless otherwise specified)
I
V
V
V
I
I
f = 1.0MHz, V
I
I
I
R
I
R
I
R
I
R
f = 60 Hz, t = 1.0 min.
V
V
F
C
E
F
C
C
C
C
C
R
CE
CE
I-O
I-O
L
L
L
L
= 1.0mA
= 1.0mA, V
= 100µA
= 100µA
= 100µA, I
= 2.0mA, V
= 2.0mA, V
= 2.0mA, V
= 2.0mA, V
= 100 , (Fig. 10)
= 100
= 100
= 100
= 6.0V
= 5.0V, T
= 5.0V, T
= 500V
= 0, f = 1.0MHz
Test Conditions
3
(Fig. 10)
(Fig. 10)
(Fig. 10)
F
A
A
CE
CE
CC
CC
CC
CC
= 1.0mA
= 25°C
= 100°C
= 5.0V
= 0
= 10V,
= 10V,
= 10V,
= 10V,
AC(rms)
Min.
2500
10
100
7.0
30
20
50
for t = 1 sec.
11
Typ.*
0.001
1.07
100
1.0
1.0
7.0
4.0
4.0
3.0
3.0
0.2
18
10
Max.
100
1.3
0.4
50
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Vac(rms)
Unit
µA
nA
µA
pF
pF
pF
µs
µs
µs
µs
%
V
V
V
V

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