ATmega256RZAV Atmel Corporation, ATmega256RZAV Datasheet - Page 298

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ATmega256RZAV

Manufacturer Part Number
ATmega256RZAV
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of ATmega256RZAV

Flash (kbytes)
256 Kbytes
Max. Operating Frequency
16 MHz
Max I/o Pins
54
Spi
3
Twi (i2c)
1
Uart
2
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
15
Analog Comparators
1
Crypto Engine
No
Sram (kbytes)
8
Eeprom (bytes)
4096
Operating Voltage (vcc)
1.8 to 3.6
Timers
6
Frequency Band
2.4 GHz
Max Data Rate (mb/s)
0.25
Antenna Diversity
No
External Pa Control
No
Power Output (dbm)
3
Receiver Sensitivity (dbm)
-101
Receive Current Consumption (ma)
16.0
Transmit Current Consumption (ma)
17.0
Link Budget (dbm)
104

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATmega256RZAV-8MU
Manufacturer:
Atmel
Quantity:
135
27.3.1
2549N–AVR–05/11
TAP Controller
Figure 27-2. TAP Controller State Diagram
The TAP controller is a 16-state finite state machine that controls the operation of the Boundary-
scan circuitry, JTAG programming circuitry, or On-chip Debug system. The state transitions
depicted in
transition) at the time of the rising edge at TCK. The initial state after a Power-on Reset is Test-
Logic-Reset.
As a definition in this document, the LSB is shifted in and out first for all Shift Registers.
Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG interface is:
At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift
Instruction Register – Shift-IR state. While in this state, shift the four bits of the JTAG
instructions into the JTAG Instruction Register from the TDI input at the rising edge of TCK.
The TMS input must be held low during input of the 3 LSBs in order to remain in the Shift-IR
state. The MSB of the instruction is shifted in when this state is left by setting TMS high.
While the instruction is shifted in from the TDI pin, the captured IR-state 0x01 is shifted out
on the TDO pin. The JTAG Instruction selects a particular Data Register as path between
TDI and TDO and controls the circuitry surrounding the selected Data Register.
1
0
Figure 27-2
Test-Logic-Reset
Run-Test/Idle
0
depend on the signal present on TMS (shown adjacent to each state
1
ATmega640/1280/1281/2560/2561
1
0
Select-DR Scan
Capture-DR
Update-DR
Pause-DR
Exit1-DR
Exit2-DR
Shift-DR
1
0
0
1
0
1
1
0
1
1
0
0
1
0
Select-IR Scan
Capture-IR
Update-IR
Pause-IR
Exit1-IR
Exit2-IR
Shift-IR
1
0
0
1
0
1
1
0
1
1
0
0
298

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