FQD17N08L Fairchild Semiconductor, FQD17N08L Datasheet - Page 4

• Manufacturer Part Number: FQD17N08L
• Manufacturer: Fairchild Semiconductor

©2000 Fairchild Semiconductor International
Typical Characteristics
10
10
10
10
1.2
1.1
1.0
0.9
0.8
Figure 9. Maximum Safe Operating Area
-100
-1
2
1
0
10
Figure 7. Breakdown Voltage Variation
0
-50
T
V
vs. Temperature
J
DS
, Junction Temperature [
Operation in This Area
is Limited by R
, Drain-Source Voltage [V]
0
1 0
1 0
※ Notes :
1. T
2. T
3. Single Pulse
- 1
1 0
0
DC
C
J
10
= 150
= 25
- 5
1
DS(on)
0 .0 5
D = 0 . 5
0 .0 2
0 .0 1
10 ms
0 .1
o
0 .2
50
C
o
C
1 ms
Figure 11. Transient Thermal Response Curve
100
1 0
(Continued)
s in g le p u ls e
o
100 s
- 4
C]
※ Notes :
1. V
2. I
t
1
, S q u a r e W a v e P u ls e D u r a t io n [ s e c ]
D
GS
= 250 μ A
150
= 0 V
10
2
1 0
- 3
200
1 0
- 2
3.0
2.5
2.0
1.5
1.0
0.5
0.0
15
12
9
6
3
0
-100
25
※ N o te s :
1 . Z
2 . D u ty F a c t o r , D = t
3 . T
Figure 8. On-Resistance Variation
Figure 10. Maximum Drain Current
1 0
θ J C
J M
- 1
P
-50
- T
DM
( t ) = 3 . 1 3 ℃ /W M a x .
50
C
= P
vs. Case Temperature
T
D M
vs. Temperature
J
T
t
, Junction Temperature [
1
C
* Z
t
0
, Case Temperature [ ℃ ]
1 0
2
1
θ J C
/t
0
75
2
( t )
50
100
1 0
1
100
o
C]
125
※ Notes :
1. V
2. I
150
D
GS
= 6.45 A
Rev. A2, December 2000
= 10 V
200
150