lh28f160bg-tl Sharp Microelectronics of the Americas, lh28f160bg-tl Datasheet - Page 23

• Manufacturer Part Number: lh28f160bg-tl
• Description: M-bit Smart Flash Memories
• Manufacturer: Sharp Microelectronics of the Americas

6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
DEVICE
UNDER
TEST
AC test inputs are driven at 2.7 V for a logic "1" and 0.0 V for a Logic "0". Input timing begins, and output timing
ends, at 1.35 V. Input rise and fall times (10% to 90%) < 10 ns.
Fig. 8 Transient Equivalent Testing
C
L
Capacitance
Includes Jig
2.7
0.0
Fig. 7 Transient Input/Output Reference Waveform for V
Load Circuit
INPUT
1.3 V
R
C
1N914
L
L
= 3.3 k
1.35
OUT
- 23 -
TEST POINTS
V
CC
Test Configuration Capacitance Loading Value
= 2.7 to 3.6 V
TEST CONFIGURATION
CC
1.35
= 2.7 to 3.6 V
LH28F160BG-TL/BGH-TL
OUTPUT
C
L
50
(pF)