NDT452AP_J23Z Fairchild Semiconductor, NDT452AP_J23Z Datasheet

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NDT452AP_J23Z

Manufacturer Part Number
NDT452AP_J23Z
Description
MOSFET P-Channel FET Enhancement Mode
Manufacturer
Fairchild Semiconductor
Datasheet

Specifications of NDT452AP_J23Z

Product Category
MOSFET
Rohs
yes
Transistor Polarity
P-Channel
Drain-source Breakdown Voltage
- 30 V
Gate-source Breakdown Voltage
+/- 20 V
Continuous Drain Current
- 5 A
Resistance Drain-source Rds (on)
0.065 Ohms
Configuration
Single Dual Drain
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Package / Case
SOT-223
Fall Time
19 ns
Minimum Operating Temperature
- 65 C
Power Dissipation
3 W
Rise Time
20 ns
Factory Pack Quantity
2500
Typical Turn-off Delay Time
40 ns
* Order option J23Z for cropped center drain lead.
Symbol
V
V
I
P
T
THERMAL CHARACTERISTICS
R
R
© 1997 Fairchild Semiconductor Corporation
Absolute Maximum Ratings
D
________________________________________________________________________________
J
DSS
GSS
D
NDT452AP
P-Channel Enhancement Mode Field Effect Transistor
General Description
Power SOT P-Channel enhancement mode power field
effect transistors are produced using Fairchild's proprietary,
high cell density, DMOS technology. This very high density
process is especially tailored to minimize on-state resistance
and provide superior switching performance. These devices
are particularly suited for low voltage applications such as
notebook computer power management and DC motor
control.
,T
JA
JC
STG
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current - Continuous
Maximum Power Dissipation
Operating and Storage Temperature Range
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
- Pulsed
T
G
A
= 25°C unless otherwise noted
D
D
(Note 1a)
(Note 1a)
(Note 1b)
(Note 1c)
(Note 1a)
(Note 1)
S
Features
-5A, -30V. R
High density cell design for extremely low R
High power and current handling capability in a widely used
surface mount package.
R
DS(ON)
DS(ON)
NDT452AP
-65 to 150
= 0.1
= 0.065
- 15
±20
-30
1.3
1.1
42
12
-5
3
@ V
@ V
GS
= -4.5V.
GS
G
= -10V
D
DS(ON)
June 1996
.
NDT452AP Rev. B1
S
Units
°C/W
°C/W
W
°C
V
V
A

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NDT452AP_J23Z Summary of contents

Page 1

... Thermal Resistance, Junction-to-Ambient R JA Thermal Resistance, Junction-to-Case Order option J23Z for cropped center drain lead. © 1997 Fairchild Semiconductor Corporation Features -5A, -30V. R High density cell design for extremely low R High power and current handling capability in a widely used surface mount package. D ...

Page 2

Electrical Characteristics (T = 25°C unless otherwise noted) A Symbol Parameter OFF CHARACTERISTICS BV Drain-Source Breakdown Voltage DSS I Zero Gate Voltage Drain Current DSS I Gate - Body Leakage, Forward GSSF I Gate - Body Leakage, Reverse GSSR ON ...

Page 3

Electrical Characteristics (T = 25°C unless otherwise noted) A Symbol Parameter DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS I Maximum Continuous Drain-Source Diode Forward Current S Drain-Source Diode Forward Voltage Reverse Recovery Time rr Notes ...

Page 4

Typical Electrical Characteristics - -10V GS -6.0 -5.0 -15 -4.5 - DRAIN-SOURCE VOLTAGE (V) DS Figure 1. On-Region Characteristics. 1 -5. -10V 1.4 GS 1.2 1 ...

Page 5

Typical Electrical Characteristics 1 -250µA 1.08 D 1.06 1.04 1.02 1 0.98 0.96 0.94 -50 - JUNCTION TEMPERATURE (°C) J Figure 7. Breakdown Voltage Variation with Temperature ...

Page 6

Typical Thermal Characteristics -10V DRAIN CURRENT (A) D Figure 13. Transconductance Variation with Drain Current and Temperature ...

Page 7

... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ACEx™ FAST Bottomless™ FASTr™ FRFET™ CoolFET™ GlobalOptoisolator™ CROSSVOLT™ GTO™ DenseTrench™ ...

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