MT28F004B5VG-8 TET TR Micron Technology Inc, MT28F004B5VG-8 TET TR Datasheet - Page 10

IC FLASH 4MBIT 80NS 40TSOP

MT28F004B5VG-8 TET TR

Manufacturer Part Number
MT28F004B5VG-8 TET TR
Description
IC FLASH 4MBIT 80NS 40TSOP
Manufacturer
Micron Technology Inc
Datasheet

Specifications of MT28F004B5VG-8 TET TR

Format - Memory
FLASH
Memory Type
FLASH - Nor
Memory Size
4M (512K x 8)
Speed
80ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
40-TSOP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
OUTPUT (READ) OPERATIONS
different types of READS. Depending on the current
mode of the device, a READ operation produces data
from the memory array, status register or device iden-
tification register. In each of these three cases, the
WE#, CE# and OE# inputs are controlled in a similar
manner. Moving between modes to perform a specific
read is described in the Command Execution section.
Memory Array
OE# and CE# must be LOW. Valid data is output on the
DQ pins when these conditions have been met and a
valid address is given. Valid data remains on the DQ
pins until the address changes, or until OE# or CE#
goes HIGH, whichever occurs first. The DQ pins con-
tinue to output new data after each address transition
as long as OE# and CE# remain LOW.
When the memory array is accessed as a 256K x 16,
BYTE# is HIGH, and data will be output on DQ0–
DQ15. To access the memory array as a 512K x 8,
BYTE# must be LOW, DQ8–DQ14 are High-Z, and all
data is output on DQ0–DQ7. The DQ15/(A - 1) pin
becomes the lowest order address input so that
524,288 locations can be read.
cally in the array read mode. All commands and their
operations are described in the Command Set and
Command Execution sections.
Status Register
the same input sequencing as a READ of the array
except that the address inputs are “Don’t Care.” The
status register contents are always output on DQ0–
DQ7, regardless of the condition of BYTE# on the
MT28F400B5. DQ8–DQ15 are LOW when BYTE# is
HIGH, and DQ8–DQ14 are High-Z when BYTE# is
LOW. Data from the status register is latched on the
falling edge of OE# or CE#, whichever occurs last. If the
contents of the status register change during a READ of
the status register, either OE# or CE# may be toggled
while the other is held LOW to update the output.
cally enters the status register read mode. In addition,
a READ during a WRITE or ERASE produces the status
register contents on DQ0–DQ7. When the device is in
the erase suspend mode, a READ operation produces
the status register contents until another command is
issued, while in certain other modes, READ STATUS
09005aef8075d1f1
MT28F004B5.fm - Rev. 4, Pub. 2/2004
The MT28F004B5 and MT28F400B5 feature three
To read the memory array, WE# must be HIGH, and
The MT28F400B5 features selectable bus widths.
After power-up or RESET, the device is automati-
Performing a READ of the status register requires
Following a WRITE or ERASE, the device automati-
SMART 5 BOOT BLOCK FLASH MEMORY
10
REGISTER may be given to return to the status register
read mode. All commands and their operations are
described in the Command Set and Command Execu-
tion sections.
Identification Registers
ters requires the same input sequencing as a READ of
the array. WE# must be HIGH, and OE# and CE# must
be LOW. However, ID register data is output only on
DQ0–DQ7, regardless of the condition of BYTE# on the
MT28F400B5. A0 is used to decode between the two
bytes of the device ID register; all other address inputs
are “Don’t Care.” When A0 is LOW, the manufacturer
compatibility ID is output, and when A0 is HIGH, the
device ID is output. DQ8–DQ15 are High-Z when
BYTE# is LOW. When BYTE# is HIGH, DQ8–DQ15 are
00h when the manufacturer compatibility ID is read
and 44h when the device ID is read.
READ IDENTIFICATION may be issued while the
device is in certain other modes. In addition, the iden-
tification register read mode can be reached by apply-
ing a super-voltage (V
method, the ID register can be read while the device is
in any mode. When A9 is returned to V
device returns to the previous mode.
INPUT OPERATIONS
array or to input a command to the CEL. A command
input issues an 8-bit command to the CEL to control
the mode of operation of the device. A WRITE is used
to input data to the memory array. The following sec-
tion describes both types of inputs. More information
describing how to use the two types of inputs to write
or erase the device is provided in the Command Execu-
tion section.
Commands
and CE# and WE# must be LOW. Addresses are “Don’t
Care” but must be held stable, except during an ERASE
CONFIRM (described in a later section). The 8-bit
command is input on DQ0–DQ7, while DQ8–DQ15 are
“Don’t Care” on the MT28F400B5. The command is
latched on the rising edge of CE# (CE#-controlled) or
WE# (WE#-controlled), whichever occurs first. The
condition of BYTE# on the MT28F400B5 has no effect
on a command input.
A READ of the two 8-bit device identification regis-
To get to the identification register read mode,
The DQ pins are used either to input data to the
To perform a command input, OE# must be HIGH,
Micron Technology, Inc., reserves the right to change products or specifications without notice.
ID
) to the A9 pin. Using this
©2002 Micron Technology, Inc.
IL
or V
4Mb
IH
, the

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