SLRC40001T/OFE,112 NXP Semiconductors, SLRC40001T/OFE,112 Datasheet - Page 115

IC I.CODE SLRC400 READER 32-SOIC

SLRC40001T/OFE,112

Manufacturer Part Number
SLRC40001T/OFE,112
Description
IC I.CODE SLRC400 READER 32-SOIC
Manufacturer
NXP Semiconductors
Series
I-Coder

Specifications of SLRC40001T/OFE,112

Rf Type
Read Only
Frequency
13.56MHz
Features
ISO15693, ISO18000-3
Package / Case
32-SOIC (0.300", 7.50mm Width)
Product
RFID Readers
Operating Temperature Range
- 25 C to + 85 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-1124-5
935269551112
SLRC400
SLRC41TOFED
Philips Semiconductors
I•CODE Reader IC
18.4 Digital Test-Signals
Digital test signals may be routed to pin SIGOUT by setting bit SignalToSIGOUT to 1. A digital test signal
may be selected via the register bits TestDigiSignalSel in Register TestDigiSelect.
The signals selected by a certain TestDigiSignalSel setting is shown in the table below:
If no test signals are used, the value for the TestDigiSel-Register shall be 00
Note: All other values of TestDigiSignalSel are for production test purposes only.
TestDigiSignalSel
E4
D4
C4
D5
C5
F4
96
00
hex
hex
hex
hex
hex
hex
hex
hex
Signal Name
no test signal
int_clock
wr_sync
rd_sync
s_clock
s_valid
s_data
s_coll
Table 18-3: Digital Test Signal Selection
Data received from the label.
Shows with 1, that the signals s_data and s_coll are valid.
Shows with 1, that a collision has been detected in the current bit.
Internal serial clock: during transmission, this is the coder-clock and during
reception this is the receiver clock.
Internal synchronised read signal (derived from the parallel µ-Processor
interface).
Internal synchronised write signal (derived from the parallel µ-Processor
interface).
Internal 13.56 MHz clock.
output as defined by SIGOUTSelect are routed to pin SIGOUT.
115
Product Specification Rev. 3.1 August 2004
Description
hex
.
SL RC400

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