LH79520N0M000B1 NXP Semiconductors, LH79520N0M000B1 Datasheet - Page 8

• Manufacturer Part Number: LH79520N0M000B1
• Manufacturer: NXP Semiconductors

Specifications of LH79520N0M000B1

• Operating Temperature (min): -40C
• Operating Temperature (max): 85C
• Processing Unit: Microcontroller
• Operating Supply Voltage (min): 1.62V
• Operating Supply Voltage (typ): 1.8V
• Operating Supply Voltage (max): 1.98V
• Package Type: LQFP
• Screening Level: Industrial
• Pin Count: 176
• Mounting: Surface Mount
• Rad Hardened: No
• Lead Free Status / RoHS Status: Not Compliant

LH79520
8
PIN NO.
145
114
115
144
150
151
152
153
155
156
174
170
173
172
171
175
176
52
53
54
56
57
58
59
60
34
35
41
42
43
44
50
51
96
97
93
94
89
90
88
98
99
98
1
PG7
PG6
PG5
PG4
PG3
PG2
PG1
PG0
PH7
PH6
PH5
PH4
PH3
PH2
PH1
PH0
CTOUT1B
nRESETIN
nRESETOUT
INT7
INT6
INT5
INT4
INT3
INT2
INT1
INT0
XTALIN
XTALOUT
XTAL32IN
XTAL32OUT
CLKINSEL
CLKIN
CLKEN
CLKOUT
UARTCLK
nTRST
TMS
TCLK
TDI
TDO
TEST1
TEST2
nTSTA
SIGNAL NAME
Input/Output
Input/Output
Output
Output
Output
Output
Output
Output
Output
TYPE
RESET, CLOCK, AND POWER CONTROLLER (RCPC)
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Table 2. LH79520 Signal Descriptions (Cont’d)
General Purpose I/O Signals - Port G
General Purpose I/O Signals - Port H
Counter/Timer Output
Reset Input
Reset Output
External Interrupt Input
External Interrupt Input
External Interrupt Input
External Interrupt Input
External Interrupt Input
External Interrupt Input
External Interrupt Input
External Interrupt Input
Crystal Input
Crystal Output
32.768 kHz Crystal Oscillator Input
32.768 kHz Crystal Oscillator Output
External Clock Select
External Clock Input (if CLKINSEL = HIGH at reset)
External Clock Enable
(if CLKINSEL = LOW at reset, then this pin functions as PF1)
Clock Out (selectable from the internal bus clock or 32.768)
External UART Clock Input (with CLKSEL = LOW)
JTAG Test Reset Input
JTAG Test Mode Select Input
JTAG Test Clock Input
JTAG Test Serial Data Input
JTAG Test Data Serial Output
Tie LOW for Normal Operation (has internal pull-down).
JTAG Debug Enable: Tie LOW for Normal Operation; pull HIGH to
enable JTAG Debugging (has internal pull-down).
Tie HIGH for Normal Operation (has internal pull-up).
Rev. 01 — 16 July 2007
COUNTER/TIMER (C/T)
NXP Semiconductors
TEST INTERFACE
DESCRIPTION
Preliminary data sheet
System-on-Chip
NOTES
1, 3
1
1
1
1
1
1
1
1
1
1
1
1
1
1