GRM1885C1H101J Murata, GRM1885C1H101J Datasheet - Page 126

GRM1885C1H101J

Manufacturer Part Number
GRM1885C1H101J
Description
Manufacturer
Murata
Datasheet

Specifications of GRM1885C1H101J

Capacitance
100pF
Tolerance (+ Or -)
5%
Voltage
50VDC
Temp Coeff (dielectric)
C0G
Operating Temp Range
-55C to 125C
Mounting Style
Surface Mount
Package / Case
0603
Construction
SMT Chip
Case Style
Ceramic Chip
Failure Rate
Not Required
Wire Form
Not Required
Product Length (mm)
1.6mm
Product Depth (mm)
0.8mm
Product Height (mm)
0.8mm
Product Diameter (mm)
Not Requiredmm
Dc
07+
Lead Free Status / Rohs Status
Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
GRM1885C1H101JA01D
Manufacturer:
MURATA
Quantity:
640 000
Part Number:
GRM1885C1H101JA01D
Manufacturer:
MURATA
Quantity:
208 000
Part Number:
GRM1885C1H101JA01J
Manufacturer:
MURATA
Quantity:
170 000
7
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
Mounting for testing: The capacitors should be mounted on the substrate as shown below using die bonding and wire bonding when tests No.11 to 15 are performed.
124
No.
13
14
15
GMA Series Specifications and Test Methods (1)
GMA Series Specifications and Test Methods(1)
Alumina substrate
Continued from the preceding page.
Humidity
(Steady State)
Humidity
Load
High
Temperature
Load
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
No defects or abnormalities
R7: Within T12.5%
R7: W.V.: 10V min.; 0.05 max.
More than 1,000MΩ or 50Ω F
(Whichever is smaller)
No defects or abnormalities
R7: Within T12.5%
R7: W.V.: 10V min.; 0.05 max.
More than 500MΩ or 25Ω F
(Whichever is smaller)
No defects or abnormalities
R7: Within T12.5%
R7: W.V.: 10V min.; 0.05 max.
More than 1,000MΩ or 50Ω F
(Whichever is smaller)
Gold land
In case Non "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (1).
Die bond
Capacitor
Specifications
In case "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (2).
Alumina substrate
Gold wire
Set the capacitor for 500T12 hours at 40T2D, in 90 to 95%
humidity.
Take it out and set it for 24T2 hours at room temperature, then
measure.
Apply the rated voltage for 500T12 hours at 40T2D, in 90 to
95% humidity and set it for 24T2 hours at room
temperature,then measure. The charge/discharge current is
less than 50mA.
A voltage treatment should be given to the capacitor, in which a
DC voltage of 200% the rated voltage is applied for one hour at
the maximum operating temperature T3D then it should be set
for 24T2 hours at room temperature and the initial measurement
should be conducted.
Then apply the above mentioned voltage continuously for
1000T12 hours at the same temperature, remove it from the
bath, and set it for 24T2 hours at room temperature, then
measure. The charge/discharge current is less than 50mA.
Gold land
Test Method
C02E.pdf
09.9.18

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