GRM1885C1H101J Murata, GRM1885C1H101J Datasheet - Page 56

• Manufacturer Part Number: GRM1885C1H101J
• Manufacturer: Murata

Specifications of GRM1885C1H101J

• Capacitance: 100pF
• Tolerance (+ Or -): 5%
• Voltage: 50VDC
• Temp Coeff (dielectric): C0G
• Operating Temp Range: -55C to 125C
• Mounting Style: Surface Mount
• Package / Case: 0603
• Construction: SMT Chip
• Case Style: Ceramic Chip
• Failure Rate: Not Required
• Wire Form: Not Required
• Product Length (mm): 1.6mm
• Product Depth (mm): 0.8mm
• Product Height (mm): 0.8mm
• Product Diameter (mm): Not Requiredmm
• Dc: 07+
• Lead Free Status / Rohs Status: Compliant

1
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
54
No.
14
15
GRM Series Specifications and Test Methods (1) (Note1) Typical Inspection
Continued from the preceding page.
Resistance
to
Soldering
Heat
Temperature
Cycle
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
GRM Series Specifications and Test Methods (1) (Note1) Typical Inspection
Item
Appearance
Capacitance
Change
Q/D.F.
I.R.
Dielectric
Strength
Appearance
Capacitance
Change
Q/D.F.
I.R.
Dielectric
Strength
The measured and observed characteristics should satisfy the
specifications in the following table.
No defects or abnormalities
Within 2.5% or 0.25pF
(Whichever is larger)
30pF and over: QU1000
30pF and below:
C: Nominal Capacitance (pF)
More than 10,000M or 500 · F (Whichever is smaller)
No defects
The measured and observed characteristics should satisfy the
specifications in the following table.
No defects or abnormalities
Within 2.5% or 0.25pF
(Whichever is larger)
30pF and over: QU1000
30pF and below:
C: Nominal Capacitance (pF)
More than 10,000M or 500 · F (Whichever is smaller)
No defects
Compensating Type
QU400+20C
Temperature
QU400+20C
In case Non "*" is added in PNs table, please refer to GRM Series Specifications and Test Methods (1).
Specifications
In case "*" is added in PNs table, please refer to GRM Series Specifications and Test Methods (2).
B1, B3, R1, R6, R7, C8
F1, F5, E4: Within 20%
[B1, B3, R6, R7, C8]
W.V.: 100V
W.V.: 50/35/25V:
*GRM32D R7/R6/C8 1E106: 0.035 max.
W.V.: 16/10V: 0.035 max.
W.V.: 6.3/4V
[E4]
W.V.: 25Vmin: 0.025 max.
[F1, F5]
W.V.: 25V min.
W.V.: 16/10V: 0.125 max.
W.V.: 6.3V: 0.15 max.
B1, B3, R1, R6, R7, C8
F1, F5, E4: Within 20%
[B1, B3, R6, R7, C8]
W.V.: 100V
W.V.: 50/35/25V:
*GRM32D R7/R6/C8 1E106: 0.035 max.
W.V.: 16/10V: 0.035 max.
W.V.: 6.3/4V
[E4]
W.V.: 25Vmin: 0.05 max.
[F1, F5]
W.V.: 25V min.
W.V.: 16/10V: 0.125 max.
W.V.: 6.3V: 0.15 max.
Please refer to individual specifications (our product specifications or the approval sheet).
: 0.025 max. (CF0.068 F)
: 0.05 max. (CU0.068 F)
: 0.025 max. (CF0.068 F)
: 0.05 max. (CU0.068 F)
High Dielectric Type
: 0.025 max.*
: 0.05 max. (CF3.3 F)
: 0.1 max. (CU3.3 F)
: 0.05 max. (CF0.1 F)
: 0.09 max. (CU0.1 F)
: 0.025 max.*
: 0.05 max. (CF3.3 F)
: 0.1 max. (CU3.3 F)
: 0.05 max. (CF0.1 F)
: 0.09 max. (CU0.1 F)
: Within 7.5%
: Within 7.5%
(Note1) This Specifications and Test Methods indicates typical inspection.
Preheat the capacitor at 120 to 150 C for 1 minute.
Immerse the capacitor in an eutectic solder or Sn-3.0Ag-0.5Cu
solder solution at 270 5 C for 10 0.5 seconds. Set at room
temperature for 24 2 hours, then measure.
•Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/–10 C for one hour and
then set at room temperature for 24 2 hours.
Perform the initial measurement.
•Preheating for GRM32/43/55
Fix the capacitor to the supporting jig in the same
manner and under the same conditions as (10).
Perform the five cycles according to the four heat treatments
shown in the following table.
Set for 24 2 hours at room temperature, then measure.
•Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/–10 C for one hour and
then set at room temperature for 24 2 hours.
Perform the initial measurement.
Time (min.)
Temp. ( C)
Step
Step
1
2
Temp. +0/–3
Operating
30 3
Min.
Temperature
100 to 120 C
170 to 200 C
1
Test Method
Temp.
Room
Continued on the following page.
2 to 3
2
Temp. +3/–0
Operating
Max.
30 3
3
1 min.
1 min.
Time
Temp.
Room
2 to 3
4
C02E.pdf
09.9.18